Home > Microscopes > JEOL JXA-8900


The JEOL JXA-8900 is an electron probe micro-analysis (EPMA) system, which is optimized for high accuracy in quantitative elemental analysis by wavelength dispersive spectroscopy (WDS). This probe is currently equipped with three WDS spectrometers and full automation featuring Probe for EPMA software.



© 2003 Lehigh University
Website Design by Mainline Media