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Hitachi 4300SE/N

The Hitachi 4300SE/N is an analytical high resolution (1.5nm/30kV) variable pressure Schottky field emission SEM (VP-FESEM). This SEM is equipped with a light element energy dispersive X-ray analyzer (EDS) and electron backscatter diffraction (EBSD) camera. Additional electron imaging modes include backscatter (BSE), gaseous secondary (GSE), forward scatter (FSE), and scanning transmission (STEM).


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