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This 200kV FEG-TEM/STEM is fitted with a Cs aberration corrector to achieve an ultimate probe-size of 0.15nm and maximize the spatial resolution of the image and spectroscopic data. It is equipped with XEDS and EELS systems. It also has a novel in-column Omega-filter to allow energy filtering of images and diffraction patterns. This instrument has the best resolution and a full remote access capability.




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