News Home

Home > News

Lehigh MSE well represented in awards, professional societies

August 2010 - Lehigh students and researchers have recently been recognized with numerous honors:

  • Joe Goldstein, former Lehigh professor of materials science and engineering and former Lehigh University vice president for research, was appointed a fellow of the Microscopy Society of America. Goldstein also founded the Lehigh Microscopy School.

  • David Williams, former Harold Chambers senior professor of materials science and engineering and former vice provost for research at Lehigh University, was appointed a fellow of the Microscopy Society of America. Williams also is a former chair of the Lehigh University Department of Materials Science and Engineering and former director of Lehigh's Electron Microscopy School and Electron Microscope Center.

  • Don Susan of Sandia National Labs, who earned a Ph.D. in materials science and engineering at Lehigh University, is the International Metallographic Society's 2011 program co-chair.

  • Wu Zhou, a Lehigh University materials science and engineering doctoral candidate, won the Presidential Student Scholar Award from the Microscopy Society of America for the research paper "Revealing Structure-Activity Relationships in Supported WO3/ZrO2 Solid Acid Catalysts Using Aberration
    Corrected High Angle Annular Dark Field Imaging."

  • Lehigh materials science students won awards at the International Metallographic Society 2010 competition in Portland, Ore. Teams led by students Dan Grande and Ukrit Thamma won George Kehl awards, the highest award for the undergraduate class, the first time two distinct Kehl awards were bestowed. The honors made the teams eligible for the tightly competitive Jacquet-Lucas Award conferred by the International Metallographic Society and ASM International. A team led by student Austin Baker won third place in the undergraduate class. Sam Lawrence, Lehigh materials science and engineering research scientist, received a second-place award in the color microscopy class.