Nanocharacterization (CAMN)

Lehigh's Center for Advanced Materials and Nanotechnology is a sister organization to CPN. CAMN provides a focal point for research on nanocharacterization, nanoparticles, sustainable nanoengineering, advanced ceramic materials, packaging for microelectronic and optoelectronics, and nanofabrication

CAMN's Nanocharacterization Laboratory at Lehigh is one of the largest electron microscopy facilities in the U.S., with a suite of 10 scanning, transmission and scanning/transmission instruments. These are well suited for characterizing nanoscale structures and chemistry via an unparalleled range of imaging and analytical methods.

The electron microscopy facility has excellent supporting services to keep the instruments at peak performance and to optimize their use. There are complete specimen preparation facilities including a Gatan PIP's, a plasma cleaner, chemical jet polishers, dimplers, wire saws, diamond cutting wheels and a comprehensive metallographic suite. In addition, there are dark rooms, facilities for digital image acquisition and manipulation, off-line computers for data analysis, and extensive microscopy-related software. Modifications to the instruments can be developed with the aid of a machine shop which is nearby.

The Nanocharacterization Laboratory houses the world's highest resolution X-ray analytical microscope - a unique instrument custom designed for nanoscale analysis and imaging.

For more information on CAMN, please visit their web site at

Zeiss 1550 Microscope