The Electron Microscopy and Nanofabrication Facility, housed in Whitaker Laboratory, contains one of the largest collections of electron microscopes of any university in the U.S., with a suite of 10 scanning, transmission and scanning/transmission instruments and a focused ion beam thinner. These are well suited for characterizing structures and chemical composition all the way down to the nanoscale, using an unparalleled range of imaging and analytical methods.

Lehigh is one of only a few universities in the U.S. to have two aberration corrected electron microscopes. It houses a high resolution x-ray analytical microscope -- a VG HB603 STEM equipped with a Nion aberration corrector: a unique instrument designed for nanoscale analysis. The Electron Microscopy and Nanofabrication Facility is also home to a JEOL ARM200F (Atomic Resolution Microscope) fitted with a cold-field emission source, a CEOS probe-forming aberration corrector, and a solid state X-ray detector.

The SEM capability of the Electron Microscopy Facility is extensive allowing us to cover specialist applications including EDS, WDS, EBSD, environmental and variable pressure microscopy, low-voltage imaging and cathodoluminescence.

The annual Lehigh Microscopy School is the largest and longest running electron microscopy course in the world. It utilizes the superb facilities of the Electron Microscopy and Nanofabrication Facility and is supplemented by additional microscopes brought in by instrument manufacturers for the duration of the courses.