Transmission Electron Microscopy
June 3-7, 2019
Cost: $3,550 (Early bird rate: $3,200)*
This course provides an overview of the concepts, instrumentation and application of TEM. It explores topics such as specimen preparation, TEM and STEM imaging modes, electron diffraction, EDS and EELS analysis, and processing of images and spectra. Coverage is also given of more specialized techniques such as electron tomography, in-situ microscopy and aberration correction.
Mark Aindow, John Hunt, Rob Keyse, Chris Kiely, Charles Lyman, and Masashi Watanabe
Each registrant receives the textbook, Transmission Electron Microscopy: A Textbook for Materials Science, 2nd Edition by Williams and Carter (Kluwer Academic/Plenum Publishers, 2009), as well as detailed laboratory notes which provide experimental results and worked problems. The book and the notes are authored by the lecturers of the course. In addition, everyone receives additional notes for specific lecturers, a list of vendors and equipment suppliers, and a link to a website containing exclusive imaging and analysis software.
* Register and pay in full by April 12