Lehigh Microscopy School
Lehigh Microscopy SchoolCoursesRegistration
Scanning Electron Microscopy
and X-ray Microanalysis
Introduction to SEM and EDS
for the New SEM Operator
Focused Ion Beam (FIB):
Instrumentation and Applications
Problem Solving: Interpretation and Analysis
Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques
Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications

Lecturers | Literature | Register | Accommodation | Meals | Getting Here

There is still time to register for all courses (including the advanced courses).

Introduction to SEM and EDS for the New Operator

June 5, 2016
Cost: $1,000
(offered only to main course participants)

A one-day course with lectures and labs related to the basic operation of the SEM. Enrollment will be limited to 60 participants who are also attending the main SEM course beginning on Monday. Attendance would benefit those who are just starting SEM or those who, despite some experience, feel that they lack a grasp of the basic ideas.

Course Outline (PDF)

Course Lecturers
Helen Chan, Alwyn Eades, Carol Kiely, Chris Kiely, Charles Lyman, Philip Oshel

Course Literature/Textbooks
Course participants will receive course notes authored by the course lecturers.

Lehigh University