Main courses

Scanning Electron Microscopy and X-ray Microanalysis

Introduction to SEM and EDS for the New SEM Operator

Specialized courses

Focused Ion Beam (FIB): Instrumentation and Applications

Problem Solving: Interpretation and Analysis of SEM/EDS/EBSD Data

Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques

Introduction to TEM

Transmission Electron Microscopy