Lehigh Microscopy School
Lehigh Microscopy SchoolCoursesRegistration
Scanning Electron Microscopy
and X-ray Microanalysis
Introduction to SEM and EDS
for the New SEM Operator
Focused Ion Beam (FIB):
Instrumentation and Applications
Problem Solving: Interpretation and Analysis
Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques
Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications

Lecturers | Literature | Register | Accommodation | Meals | Getting Here

There is still time to register for all courses (including the advanced courses).

Focused Ion Beam (FIB): Instrumentation and Applications

June 6-10, 2016
Cost: $3,400

This course is designed for those using or are interested in using the FIB or FIB/SEM platforms in academic, governmental, or industrial laboratories in either the physical or biological sciences. Basic ion-solid interaction theory will be introduced and used in describing methods of specimen preparation for SEM, TEM, AFM, Auger, SIMS, and atom probe. Other topics include 2D/3D FIB/SEM analytical characterization, milling/deposition techniques for nanotechnology, and advances in instrumentation.

Course Lecturers
Lucille Giannuzzi, Joe Michael, Keana Scott

Course Outline (PDF)

Course Literature/Textbooks
Each registrant teceives the textbook, Introduction to Focused Ion Beam: Instrumentation, Theory, Techniques and Practice (2005) (eds. L. A. Giannuzzi and F. A. Stevie) Springer Publishers, as well as detailed laboratory notes which provide experimental results and worked problems. The book and the notes are authored by the lecturers of the course. In addition, everyone receives additional notes for specific lectures, a list of vendors and equipment suppliers, and a link to a website containing exclusive imaging and analysis software.

Lehigh University