Home > Facilities > Scanning Probe Instrumentation

Scanning Probe Instrumentation

An atomic force microscope (AFM) is available for in situ nanoscale surface imaging in air or under desired solution. This device can operate in contact or tapping mode, with electrochemical stages for control of reactions and temperatures up to 150 ℃. A Hysitron Triboscope Nanoindentation attachment allows measurement of elasticity and plasticity from 25 to 150 ℃, with indentations as shallow as 20 nm. Nano-wear measurements are also possible.

  • Scanning Probe Microscopy
  • Digital Instruments (DI) Nanoscope III
  • Surface imaging in air or in solution
  • Contact (AFM) or Tapping Mode
  • Electrochemical stages