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Electron Microscopy

Scanning Transmission Electron Microscopes

Transmission Electron Microscopes

  • JEOL 2200FS - A Schottky field-emission source, Cs correction, and an in-column energy filter make this an outstanding analytical microscope.
  • JEOL 2000FX

Scanning Electron Microscopes

  • Hitachi S-4300 SEN - Schottky source, EBSD, EDS, Variable pressure
  • FEI XL30 ESEM - Environmental operation, EBSD, EDS
  • JEOL 6400CL - Cathodoluminescence
  • JEOL 733 - Microprobe with updated computer system

Focused Ion Beam Equipment