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Procedural Circuit Simulation with Decida
Booth, R.V.H. Presented at ICCAD San Jose, CA, November 10, 2002 |
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An Extensible Compact Model Description Language and Compiler
paper, talk Booth, R.V.H. Presented at the Behavioral Modeling and Simulation Workshop Santa Rosa, CA, October 10-12, 2001 |
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A Designer-Customizable Design Environment for Analog/Mixed-Signal
Circuit Design
Toth, M.S.;Booth, R.V. Presented at the O'Reilly Open-Source Convention San Diego CA, July 23-27, 2001 |
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A Powerful TCAD System Including Advanced RSM Techniques For
Various Engineering Optimization Problems
Cartuyvels, R.;Booth, R.;Kubicek, S.;Dupas, L.;De Meyer, K. Presented at the Conference on Simulation of Semiconductor Devices and Processes (SISDEP) Vienna, Austria, 1993 |
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Process Technology Optimization Using an Integrated
Process and Device Simulation Sequencing System
Cartuyvels, R.;Booth, R.;Dupas, L.;De Meyer, K. Presented at the European Solid-State Circuits Device Research Conference (ESSDERC) Leuven, Belgium, 1992 |
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An Integrated Process and Device Simulation Sequencing System
for Process Technology Design Optimization
Cartuyvels, R.;Booth, R.;Dupas, L.;De Meyer, K. Presented at the Conference on Simulation of Semiconductor Devices and Processes (SISDEP) Zurich, Switzerland, September 1991 |
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Process Technology Design Optimization:
Response Surface Method Approach (Tutorial)
R. Booth presented at Inter-University Micro-Electronics Center Leuven, Belgium, 1992 |
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New Technique to Improve Response-Surface-Method Model Fitting
Accuracy for Process Technology and Device Design Optimization
R. Booth, L. Dupas, R. Cartuyvels and K. De Meyer presented at International Workshop on VLSI Process and Device Modeling (VPAD) Oiso Kanagawa Japan, May 1991 |
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Computer Integrated Manufacturing as a Tool for
Yield Improvement and Quality Assurance
K. De Meyer, R. Booth and L. Dupas presented at Internepcon/Semiconductor Asia-Pacific 1990 November 1990 |
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Simulation of Spatial Profiles of Hot-Carrier Injection
Using a MINIMOS Post-Processor
Booth, R. Presented at the MINIMOS Users' Symposium Vienna Austria, June 1989 |
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CCD Analog Adaptive Filter Diagnostic Evaluation
Mack, I.A.; White, M.H.; Booth, R.V. presented |
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CMOS Device Modeling for VLSI
M. White and R. Booth presented at the Custom Integrated Circuits Conference Rochester NY, 1981 |
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Modeling of correlated noise in RF bipolar devices
Martin, S.; Booth, R.; Chyan, Y.-F.; Frei, M.; Goldthorp, D.; Lee, K.H.; Moinian, S.; Ng, K.; Subramaniam, P. Microwave Symposium Digest, 1998 IEEE MTT-S International Volume: 2, 1998 Page(s): 941-944 vol.2 |
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A 3-terminal model for diffused and ion-implanted resistors
Booth, R.V.H.; McAndrew, C.C. IEEE Transactions on Electron Devices Volume: 44 Issue: 5, May 1997 Page(s): 809-814 |
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Process Technology Optimization Using an Integrated
Process and Device Simulation Sequencing System
Cartuyvels, R.;Booth, R.;Dupas, L.;De Meyer, K. Microelectronic Engineering Volume: 19, 1992 Page(s): 507-510 |
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Comparison of symmetrical and asymmetrical hot-electron injection
in MOS transistors
Booth, R.;Yoon, S.;White, M.;Young, D. Solid-State Electronics Volume: 34 Number: 6, June 1991 Page(s): 599-604 |
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Simulation of a MOS Transistor with Spatially Nonuniform Channel
Parameters
Booth, R.;White, M. IEEE Transactions on Computer-Aided Design Volume: 9 Number 12 December 1990 Page(s): 1354-7 |
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An analytical model for the lateral channel electric field in
LDD structures
Hu, Y.; Booth, R.V.H.; White, M.H. IEEE Transactions on Electron Devices Volume: 37 Issue: 10, Oct. 1990 Page(s): 2254-2264 |
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Static and dynamic transconductance of MOSFETs
Sharma, U.; Booth, R.V.H.; White, M.H. IEEE Transactions on Electron Devices Volume: 36 Issue: 5, May 1989 Page(s): 954-962 |
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A time-dependent parameter acquisition system for the
characterization of MOS transistors and SONOS memory devices
Sharma, U.; Booth, R.V.H.; White, M.H. IEEE Transactions on Instrumentation and Measurement Volume: 38 Issue: 1, Feb. 1989 Page(s): 49-53 |
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The Effect of Channel Implants on MOS Transistor Characterization
Booth, R.;White, M.;Wong, H.-S.;Krutsick, T. IEEE Transactions on Electron Devices Volume: 34 Number 12 December 1987 Page(s): 2501-9 |
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Modeling of Transconductance Degradation and Extraction of Threshold
Voltage in Thin Oxide MOSFET's
Wong, H.-S.;White, M.;Krutsick, T.;Booth, R. Solid-State Electronics Volume: 30 Number 9 September 1987 Page(s): 953-68 |
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An Improved Method of MOSFET Modeling and Parameter Extraction
Krutsick, T.;White, M.;Wong H.-S.;Booth, R. IEEE Transactions on Electron Devices Volume: 34 Number: 8 August 1987 Page(s): 1676-80 |
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An Experimental Method for the Determination of the Saturation Point
of a MOSFET
Booth, R.;White, M. IEEE Transactions on Electron Devices Volume: 31 Number: 2 February 1984 Page(s): 247-51 |