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MAIN COURSES

Scanning Electron Microscopy and X-ray Microanalysis

Introduction to SEM and EDS for the New Operator

SPECIALIZED COURSES

Focused Ion Beam (FIB): Instrumentation and Applications

Problem Solving: Interpretation and Analysis of SEM/EDS/EBSD Data

Quantitative X-ray Microanalysis: Problem Solving Using EDS and WDS Techniques

Scanning Transmission Electron Microscopy

 

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