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  Instrumentation

In the past five years the following manufacturers have brought their top-of-the-line instruments, the largest array of new instruments at any course in the world:

Scanning Electron Microscopes
ASPEX, LLC

Carl Zeiss EVO SMT

Carl Zeiss SMT Ultra 55

FEI Company

Hitachi High Technologies America, Inc.

JEOL USA, Inc.

JEOL 8900 Electron Microprobe

Focused Ion Beam System
Carl Zeiss NTS, LLC

FEI Dual Beam 235 FIB

Analytical Transmission Electron Microscopes
JEOL 2200FS-Omega Filter, CEOS aberration corrector

VG Microscopes HB-603, Nion aberration corrector

Gatan, Inc.

JEOL 2000FX-Gatan PEELS

X-ray and Other Analyis Systems
Advanced MicroBeam Inc.

Bruker AXS Microanalysis

EDAX, Inc.

Evex

Gatan Cathodoluminescence (CL) System

Gatan 688 Digiscan with Digital Micrograph

Gatan/XRT X-ray Ultramicroscope

HKL EBSD

Oxford Instruments

Princeton Gamma Tech (Bruker AXS) Spirit

ResAlta Research Technologies

Tescan

TSL/EDAX

Thermo Fisher Scientific

Specimen Coating and Sample Preparation Equipment
Denton Vacuum

Fischione Instruments

Omniprobe

SPI Supplies

Scanned Probe Microscopes
Asylum Research

Agilent Technologies

Hysitron

RHK Technology

Veeco

 

Lehigh University's new JEM-ARM200F aberration-corrected scanning transmission electron microscope.
       
 
Lehigh University