housed in Whitaker Laboratory, contains one of the largest collections of electron microscopes of any university in the U.S., with a suite of 10 scanning, transmission and scanning/transmission instruments and a focused ion beam thinner. These are well suited for characterizing structures and chemical composition all the way down to the nanoscale, using an unparalleled range of imaging and analytical methods.
Lehigh is one of only a few universities in the U.S. to have two aberration corrected electron microscopes. It houses the world's highest resolution x-ray analytical microscope-a VG HB603 STEM equipped with a Nion aberration corrector: a unique instrument designed for nanoscale analysis. The Nanocharacterization Laboratory also is home to a JEOL ARM200F (Atomic Resolution Microscope) fitted with a cold-field emission source, a CEOS probe-forming aberration corrector, a solid state X-ray detector and an advanced EELS imaging filter.
The SEM capability of the Nanocharacterization Lab is extensive allowing us to cover specialist applications including EDS, WDS, EBSD, environmental and variable pressure microscopy, low-voltage imaging and cathodoluminescence.
The annual Lehigh Microscopy School is the largest and longest running electron microscopy course in the world. It utilizes the superb facilities of the Nanocharacterization Lab and is supplemented by additional microscopes brought in by instrument manufacturers for the duration of the courses.