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Lucille A. Giannuzzi of FEI Company presents on "Optimizing Deposition and Milling Strategies" in a session instructed with Joe Michael of Sandia National Laboratories and John Mansfield of University of Michigan. |
June 2010 -- Engineers, scientists, technicians, and others converged on Lehigh University's Whitaker Laboratory June 6-18, 2010, for the 40th annual Lehigh Microscopy School.
More than 130 people attended classes during the two-week school, gaining hands-on experience and instruction in microscopy, microanalysis, and top-of-the-line instruments. The more than 30 lecturers who gave presentations and worked with students in small groups were experts in microscopy and microanalysis at the world's leading research institutions and universities.
Presenters included members of Lehigh University's materials science and engineering and chemistry departments.
This year marked the 40th anniversary of the Microscopy School, which was started in 1970 by Joe Goldstein, a professor of materials science and engineering at Lehigh University from 1964 to 1983. Since its inception, more than 5,000 students have taken courses through Lehigh Microscopy School, hailing from all 50 states and more than 30 countries.
Feedback from 2010 partcipants:
Lehigh Microscopy School students received copies of textbooks authored by course lecturers, a DVD of imaging and analysis software, presentation PowerPoint slides, and a laboratory workbook authored by lecturers. The school included a mid-week banquet for participants each week. About 20 Lehigh University employees, graduate students, and undergraduate students staffed the event.
Lehigh University is a leading center for electron microscopy; its Nanocharacterization Laboratory houses the largest electron microscopy laboratory in the United States. It also has major research facilities for Light Microscopy and Image Analysis, Scanning Probe Instrumentation, and more, making Lehigh's microscopy facilities the country's most advanced university-based center of its kind.
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-- Amy White
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Copyright © 2007-08 Lehigh Microscopy
School
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