Lehigh Microscopy School

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June 9-14, 2013
Lehigh University
Bethlehem, PA USA

43 Years of Excellence


	2013 Courses


	MAIN COURSES:

	Scanning Electron Microscopy and X-ray Microanalysis

	Introduction to SEM and EDS for the New SEM Operator

	SPECIALIZED COURSES:

	Focused Ion Beam (FIB): Instrumentation and Applications

	Problem Solving: Interpretation and Analysis of SEM/EDS/EBSD Data

	Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques

	Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications

See photos from Lehigh Microscopy School's 40th anniversary

See article about Lehigh Microscopy School's 40th anniversary