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LU Microscopes in the News
FBI's Anthrax Analysis
Bringing 2020 Vision to the Nano-world
Remote Microscopy and Distance Learning
 

June 6-18, 2010
Lehigh University
Bethlehem, PA USA

40th Anniversery

 

"The lecturers were excellent - as excited as little kids in a candy store. "

-From 2009 participant

  
2010 Courses
MAIN COURSE:
Scanning Electron Microscopy
and X-ray Microanalysis
Introduction to SEM and EDS
for the New SEM Operator
ADVANCED COURSES:
Problem Solving with SEM
and X-ray Microanalysis
Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques
Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications
Focused Ion Beam (FIB)
Instrumentation and Applications
Scanning Probe Microscopy:
From Fundamentals to Advanced Applications
   
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