Lehigh Microscopy School
 
   
Lehigh Microscopy SchoolCoursesRegistration
MAIN COURSES:
Scanning Electron Microscopy
and X-ray Microanalysis
Introduction to SEM and EDS
for the New SEM Operator
SPECIALIZED COURSES:
Focused Ion Beam (FIB):
Instrumentation and Applications
Problem Solving: Interpretation and Analysis
of SEM/EDS/EBSD Data
Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques
Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications

   
 

Lecturers | Literature | Register | Accommodation | Meals | Getting Here


Scanning Electron Microscopy and X-ray Microanalysis

June 8-12, 2015
Cost: $3,300

This course is designed for individuals who use scanning electron microscopy and x-ray microanalysis in academic, governmental, or industrial laboratories: engineers, technicians, physical and biological scientists, clinicians, geologists, forensic scientists and technical managers. Through an integrated series of lectures and laboratory sessions, it will provide a working knowledge of the principles of these two related techniques as well as an introduction to variable-pressure (environmental) and low-voltage SEM. Special optional sessions will be conducted for students interested specifically in specialized imaging techniques, x-ray analysis of difficult specimens, organic materials, electronic materials, fracture/failure analysis, and forensic analysis. Students are encouraged to bring their own specimens to the course.

Course Lecturers
Bob Anderhalt, John Armstrong, Paul Carpenter, Helen Chan, Alwyn Eades, Richard Hertzberg, Rob Keyse, Carol Kiely, Chris Kiely, Dan Kremser, Heather Lowers, Charles Lyman, John Mansfield, Joe Michael, William Mushock, Dale Newbury, Philip Oshel, Frank Platek, Nicholas Ritchie, Keana Scott, John Henry Scott, Bradley Thiel

Course Outline (PDF)

Course Literature/Textbooks
Each registrant receives the textbook, Scanning Electron Microscopy and X-ray Microanalysis, 3rd edition, Kluwer/Springer Publishers (2003), as well as detailed laboratory notes which provide experimental results and worked problems. The book and the notes are authored by the lecturers of the course. In addition, everyone receives additional notes for specific lecturers, a list of vendors and equipment suppliers, and a link to a website containing exclusive imaging and analysis software.

Register and pay in full by April 14 to receive an early bird discount! See registration form for prices.

   
 
Lehigh University