Lehigh Microscopy School
 
   
Lehigh Microscopy SchoolCoursesRegistration
MAIN COURSES:
Scanning Electron Microscopy
and X-ray Microanalysis
Introduction to SEM and EDS
for the New SEM Operator
SPECIALIZED COURSES:
Focused Ion Beam (FIB):
Instrumentation and Applications
Problem Solving: Interpretation and Analysis
of SEM/EDS/EBSD Data
Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques
Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications
   
 

Lecturers | Literature | Register | Accommodation | Meals | Getting Here


Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques

June 9-13, 2014
Cost: $3,250

This course is for SEM and microprobe operators and supervisors who wish to further advance their knowledge of x-ray microanalysis. Emphasis will be placed on the physical concepts and practical details required for successful quantitative analysis. Learn how to perform EDS and WDS microanalysis on bulk specimens, layered materials, particles and beam-sensitive materials. Master quantitative aspects including ZAF and Φ(ρz) corrections. Discover emerging technologies such as silicon drift detectors, quantitative x-ray mapping, and microanalysis in a variable pressure SEM. Computer-aided imaging and microanalysis will be introduced with special emphasis placed on the accuracy and reliability of automated analysis. Students are encouraged to bring their own specimens to the course.

X-ray microanalysis in the SEM performed with energy dispersive spectrometry (EDS) and/or wavelength dispersive spectrometry (WDS) can deliver accurate, statistically rigorous results. Unfortunately, often it does not. Learn how to recognize the difference between good and bad results, and become part of the solution and not the problem.

Course Outline (PDF)

Course Lecturers
John Armstrong, Paul Carpenter, Dan Kremser, Eric Lifshin, and Nicholas Ritchie

Course Literature/Textbooks
Each registrant receives the textbook, Electron Probe Quantitation, Kluwer/Springer Publishers (1991), as well as detailed laboratory notes which provide experimental results and worked problems. The book and the notes are authored by the lecturers of the course. In addition, everyone receives additional notes for specific lecturers, a list of vendors and equipment suppliers, and a link to a website containing exclusive imaging and analysis software.

Register and pay in full by April 15 to receive an early bird discount! See registration form for prices.

NOTE: Registration deadline is May 8 for this course!

   
 
Lehigh University