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Lecturers
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Cost: $2,550
Provides an understanding of the concepts, instrumentation and applications of STEM, including the practical implementation of aberration correction. Topics covered include: STEM imaging, EDS, EELS, CBED, tomography, data manipulation, sample preparation, and a review of complementary techiniques.
Course Outline MS
Word Format | PDF Format
Course Lecturers
Dave Ackland, Rocco Cerchiara, Alwyn Eades, John Hunt, Tom Kelly, Chris Kiely, Charles Lyman, and Masashi Watanabe
Course Literature/Textbooks
Each registrant receives the textbook, Transmission
Electron Microscopy: A Textbook for Materials Science by Williams
and Carter (Kluwer Academic/Plenum Publishers, 1996), as well as
detailed laboratory notes which provide experimental results and
worked problems. The book and the notes are authored by the lecturers
of the course. In addition, everyone receives additional notes for
specific lecturers, a list of vendors and equipment suppliers, and
the Lehigh CD-ROM. |
