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Lecturers
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Cost: $3,100
This course provides an understanding of the concepts, instrumentation, and applications of STEM. The course explores basic and advanced levels of the following topics: STEM imaging, aberration correction, EDS, EELS, CBED, tomography, data manipulation, sample preparation, and a review of complementary techniques.
Course Outline (PDF)
Course Lecturers
Alwyn Eades, John Hunt, Chris Kiely, Charles Lyman, and Masashi Watanabe
Course Literature/Textbooks
Each registrant receives the textbook, Transmission
Electron Microscopy: A Textbook for Materials Science, 2nd Edition by Williams
and Carter (Kluwer Academic/Plenum Publishers, 2009), as well as
detailed laboratory notes which provide experimental results and
worked problems. The book and the notes are authored by the lecturers
of the course. In addition, everyone receives additional notes for
specific lecturers, a list of vendors and equipment suppliers, and
the Lehigh DVD. |
