Lehigh Microscopy School
 
   
Lehigh Microscopy SchoolCoursesRegistration
MAIN COURSE:
Scanning Electron Microscopy
and X-ray Microanalysis
Introduction to SEM and EDS
for the New SEM Operator
ADVANCED COURSES:
Problem Solving with SEM
and X-ray Microanalysis
Quantitative X-ray Microanalysis:
Problem Solving Using EDS and WDS Techniques
Analytical Electron Microscopy
at the Nanometer-Scale
Focused Ion Beam (FIB)
Instrumentation and Applications
Scanning Probe Microscopy:
From Fundamentals to Advanced Applications
   
 


Worlds Best Microscopy Courses

Lehigh’s SEM courses were founded by Joe Goldstein in 1970. More than three decades later, the Lehigh Microscopy School is widely recognized as the largest and best in the world.

Over 4,500 engineers, scientists, and technicians have taken our courses, coming from 48 states and 29 countries. Goldstein et al., the SEM textbook, has worldwide sales of over 46,000 copies since its first publication in 1975.

Fifteen of our lecturers have served as president of one of the major microscopy, microanalysis, or materials societies.

Lecturers have nearly 700 years of combined experience in microscopy and microanalysis at the world’s leading research institutions and universities.

   
   
Dave Ackland
MSA Outstanding Technologist Award 1996
       

 

 
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