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FEI Scios Dual Beam FIB

This Dual Beam FIB is a combination of a scanning electron Microscope (SEM) with a focused Gallium ion beam (FIB) system, like two microscopes in one. It can be used for preparing TEM samples from specific localized sites and the nano-patterning of surfaces. It is equipped with a platinum deposition system, a fully rotatable micromanipulator, an X-ray detector and a back-scattered electron diffraction pattern recording system.

 

 

 

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