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FEI Strata DB 235

This dual-beam instrument combines an SEM with an ion beam system for nano-scale erosion of the sample. The SEM is a high-performance field-emission microscope featuring a back-scattered diffraction (EBSD) camera and an X-ray analysis system. The ion-beam system has a high-brightness gallium ion source that can cut structures on the scale of nanometers to millimeters. A platinum deposition system and an in-situ micro-manipulator are included in this very busy instrument.

 

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