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David B. Williams Publications Continued

I. Books Written and Edited
II. Refereed Individual Chapters/Papers in Books
III. Refereed Journal Publications
IV. Extend Abstracts/Conference Papers

IV. Conference and Abstract Publications

  1. Williams, D. B., and Watanabe, M “Quantitative X-ray Analysis of Materials by Spherical-Aberration Corrected Analytical Electron Microscopes” ALC ‘05 Kailua Kona, HA, December 2005, accepted

  2. Watanabe, M. and Williams, D. B. “Frontiers of X-ray Analysis in Analytical Electron Microscopy: Toward Atomic-Scale Resolution and Single-Atom Sensitivity” FEMMS 2005, Kasteel Valsbroek, The Netherlands, September 2005, accepted.

  3. Watanabe, M., Ackland, D. W., Burrows, A., Kiely, C. J., Williams D. B., Kanno, M. and Hynes, R. “Advantages of Cs-correctors for Spectrometry in STEM” Microscopy and Microanalysis, 2005, accepted for publication.

  4. M. Watanabe and D.B Williams “X-ray Analysis in the AEM with Angstrom-Level Spatial Resolution and Single-Atom Detection” Microscopy and Microanalysis, 2005, accepted for publication

  5. Gupta, P., Jain, H., Williams, D. B., Kalinin , S.V., Shin, J and Baddorf, A. P. “Direct observation of ferroelectricity in a confined crystallite” Microscopy and Microanalysis, 2005, accepted for publication

  6. Li, C. and Williams , D .B. “Application of Automated Crystallography for Transmission Electron Microscopy (ACT) in Material Characterization” Micro Nano Breakthrough Conference, Sheraton Airport Hotel, Portland, OR, July 28-29, (2004).

  7. Williams D. B. and Watanabe, M., “Improvements to Elemental Mapping via X-ray Spectrum Imaging Combined with Principal Component Analysis and Zero-Peak Deconvolution” Microscopy and Microanalysis, 2004, Eds. I. M. Anderson, R. Price, E. Hall, E. Clark and S. McKernan, 1040-1041, (2004) .

  8. Watanabe, M., Burrows, A., Herzing, A. A., Kiely, C. J., Williams, D .B., Hutchings, G. and Liz-Marzin, L. M. “High Resolution X-Ray Elemental Mapping of Nanoparticles in the STEM” Microscopy and Microanalysis 2004 Eds. I. M. Anderson, R. Price, E. Hall, E. Clark and S. McKernan, 468-469, (2004)

  9. Williams, D. B., Watanabe, M and Li, C., “Accurate Evaluation of Boundary Segregation by STEM X-ray Mapping and Orientation Imaging in TEM”, TMS Letters, 1 , 103-104, (2004).

  10. Williams, D. B. and Watanabe, M. “Quantitative Microanalysis and Elemental Imaging in the AEM: a Tutorial”, JSPS Committee 141 Report for Atomic Level Characterization '03, Kauai , 1-6, (2003).

  11. Watanabe, M. and Williams, D.B., “Improvements to the Energy Resolution of an X-ray Energy Dispersive Spectrum by Deconvolution Using the Zero Strobe Peak” Microscopy and Microanalysis 2003, Eds. D. Piston, J. Bruley, I. M. Anderson, P. Kotula, G. Solorzano, A. Lockley and S. McKernan, 124-125, (2003) .

  12. Li, C and Williams D. B. “P Segregation to Low-Angle a -Fe Grain Boundaries”, Microscopy and Microanalysis 2003, Eds. D. Piston, J. Bruley, I. M. Anderson, P. Kotula, G. Solorzano, A. Lockley and S. McKernan, 588-589, (2003) .

  13. Watanabe, M. and Williams, D.B., “Accurate Determination of Boundary Coverages of Segregating Elements by STEM X-ray Mapping Combined with the z -factor Method” Microscopy and Microanalysis 2003, Eds. D. Piston, J. Bruley, I. M. Anderson, P. Kotula, G. Solorzano, A. Lockley and S. McKernan, 668-669, (2003) .

  14. Williams, D. B. and Watanabe, M. “Effects of Sample Preparation in Analysis: Spectroscopy” Microscopy and Microanalysis 2003, Eds. D. Piston, J. Bruley, I. M. Anderson, P. Kotula, G. Solorzano, A. Lockley and S. McKernan, 104-105, (2003) .

  15. Williams, D.B., Watanabe, M. and Li, C. “Combined Elemental and Orientation Imaging of Segregation to Grain Boundaries” ISAM, NIRIM, Tsukuba , Japan , April, 2003.

  16. Alamgir, F. M., Jain, H., Williams, D. B. and Hug, G., “EXELFS and EXAFS: Complementary Probes Into the Structure of Metallic Glasses” in Microscopy and Microanalysis, Eds. E. Voelkl, D. Piston, R. Gauvin, A. J. Lockley, G. W. Bailey and S. McKernan, Cambridge University Press, NY, 8 , supplement 2, 1598-1599CD, (2002)

  17. Li, C., Watanabe, M., Li, J., Ackland, D. W. and Williams, D. B., “Sb Grain Boundary Segregation in Rapidly Solidified Cu-Sb Alloy” in Microscopy and Microanalysis, Eds. E. Voelkl, D. Piston, R. Gauvin, A. J. Lockley, G. W. Bailey and S. McKernan, Cambridge University Press, NY, , 8 , supplement 2, 1588-1589CD, (2002).

  18. Watanabe, M., Williams, D. B. and Tomokiyo, Y., “ Comparison of Detection Limits for Elemental Mapping by EF-TEM and STEM-XEDS” in Microscopy and Microanalysis, Eds. E. Voelkl, D. Piston, R. Gauvin, A. J. Lockley, G. W. Bailey and S. McKernan, Cambridge University Press, NY, 8 , supplement 2, 608-609CD (2002).

  19. Burke, M. G., Watanabe, M., Williams, D. B., Hyde, J. M. “Irradiation-Induced Development of Nanoscale Features in Steel: Complementary 3D-APFIM and FEG-STEM Characterization” in Microscopy and Microanalysis, Eds. E. Voelkl, D. Piston, R. Gauvin, A. J. Lockley, G. W. Bailey and S. McKernan, Cambridge University Press, NY, 8 , supplement 2, 292-293, (2002).

  20. Williams, D. B. Watanabe, M. and Li, C., “Quantitative X-ray Microanalysis and Imaging of Thin Foils: A Tutorial” EMAS 2002, 5th Regional Workshop, Szczyrk , Poland , 145-154, (2002).

  21. Williams, D. B. Watanabe, M. and Li, C., “High Resolution Chemical and Structural Mapping in the STEM” XI Conference on Electron Microscopy of Solids, Krynica , Poland , (2002).

  22. Williams, D. B., Watanabe, M. and Burke, M. G. “Quantitative Microanalysis with High Spatial Resolution: Application of FEG–STEM XEDS Microanalysis to the Characterization of Complex Microstructures in Irradiated Low Alloy Steel” Proceedings ALC ‘01 Nara , Japan (2001) 133-137.

  23. Claves, S.R. Misiolek, W.Z., Williams D.B., “ Microtexture Studies of Extruded Aluminum using Electron Backscatter Diffraction” in Microscopy and Microanalysis, Eds. G.W. Bailey, R.L. Price, E. Voelkl and I.H. Musselman, Springer, New York, NY, 7 , supplement 2, 374-375, (2001).

  24. Papworth, A.J. and Williams D.B., “ELNES Study of Temper Embrittled Steel” in Microscopy and Microanalysis, Eds. G.W. Bailey, R.L. Price, E. Voelkl and I.H. Musselman, Springer, New York, NY, 7 , supplement 2, 300-301, (2001).

  25. Watanabe, M. and Williams, D.B., “Future Direction of High-Resolution X-Ray Microanalysis in the AEM”, in Microscopy and Microanalysis, Eds. G.W. Bailey, R.L. Price, E. Voelkl and I.H. Musselman, Springer, New York, NY, 7 , supplement 2, 212-213, (2001).

  26. Alamgir, F. M., Jain, H., Williams, D. B., Hug, G., Schwarz, R. B. and Jin O., “EXAFS and EXELFS study of the structure of Pd-Ni-P bulk metallic glasses” Mater. Res. Soc. Proc. 644, L2.4.1. - L2.4.6 (2001).

  27. Farrington, G. C. and Williams, D.B., “ Darwin Goes to College: Materials Research and Education in the Internet Age”, Plenary Presentation, ICMAT 2001, MRS, Singapore , p. 4. (2001).

  28. Voelkl, E., Allard, L. F., Tarnoff, D., Williams, D.B. and Fama, L. A. “Teaching Microscopy and Microscope Theory Based on Remote Instrument Access and Instrument Automation” Microscopy and Microanalysis 2000, eds. G.W. Bailey, S. McKernan, R. L. Price, S. D. Walck, P.-M. Charest and R. Gauvin, Springer, New York , NY , 6 , supplement 2, 1162-1163, (2000).

  29. Claves, S. R., Misiolek, W. Z., Van Geertruyden, W. H. and Williams, D. B., “Use of Electron Backscatter Diffraction Techniques in Characterization of 6XXX Aluminum Alloy Extrusions” Microscopy and Microanalysis 2000, eds. G.W. Bailey, S. McKernan, R. L. Price, S. D. Walck, P.-M. Charest and R. Gauvin, Springer, New York , NY , 6 , supplement 2, 954-955, (2000).

  30. Papworth, A. J., Watanabe, M. and Williams, D. B., “The Determination of Carbide Types in Thin-Film Specimens of Low-Alloy Steels” Microscopy and Microanalysis 2000, eds. G.W. Bailey, S. McKernan, R. L. Price, S. D. Walck, P.-M. Charest and R. Gauvin, Springer, New York , NY , 6 , supplement 2, 348-349, (2000).

  31. Alamgir, F., M., Hug, G., Williams, D. B., Jain, H. and Schwarz, R,. “Analysis of the Structure of Bulk Metallic Glasses Using EXELFS” Microscopy and Microanalysis 2000, eds. G.W. Bailey, S. McKernan, R. L. Price, S. D. Walck, P.-M. Charest and R. Gauvin, Springer, New York , NY , 6 , supplement 2, 194-195, (2000).

  32. Williams, D. B. and Watanabe, M. “X-ray Microanalysis in the STEM” Microscopy and Microanalysis 2000 eds G.W. Bailey, S. McKernan, R. L. Price, S. D. Walck, P.-M. Charest and R. Gauvin, Springer, New York , NY , 6 , supplement 2, 112-113, (2000).

  33. Papworth, A. J., Jain, H., Agrawal, D. K., Cheng, J. and Williams, D. B., “Microstructural and Micro-Compositional Analysis of a WC/Co Composites, Prepared by Microwave and Conventional Thermal Sintering” Microbeam Analysis 2000, eds. D. B. Williams and R. Shimizu, Institute of Physics, Bristol and Philadelphia PA, 165 , 165-166 (2000).

  34. Watanabe, M. and Williams, D. B., “Theoretical Simulation of Probe Sizes for Microanalysis in AEM” Microbeam Analysis 2000, eds. D. B. Williams and R. Shimizu, Institute of Physics, Bristol and Philadelphia PA, 165 , 155-156, (2000).

  35. Wang, C. M., Cargill, G. S. III, Chan H. M., Harmer, M. P. and Williams, D. B., “Atomic Structural environment of Grain Boundary Segregated Y in Creep Resistant Alumina” Microbeam Analysis 2000, eds. D. B. Williams and R. Shimizu, Institute of Physics, Bristol and Philadelphia PA, 165 , 151-152 (2000).

  36. Papworth, A. J. and Williams, D. B., “Information Obtained by X-ray Mapping Large Sample Areas in a FEG STEM” Microbeam Analysis 2000, eds. D. B. Williams and R. Shimizu, Institute of Physics, Bristol and Philadelphia PA, 165 , 143-144, (2000).

  37. Williams, D. B. and Keast, V. J. “An Electronic Explanation For Grain-Boundary Brittle Failure” Acta Microscopica,, 8 , suppl. A, 351-352, (1999).

  38. Williams, D. B. and Watanabe, M. “Single-Atom Detection By X-ray Microanalysis in the AEM?” Acta Microscopica,, 8 , suppl. A, 347-350, (1999).

  39. Williams, D. B. and Watanabe, M. “High Resolution X-ray Microanalysis in the Transmission Electron Microscope” X Conference on Electron Microscopy of Solids, eds. E. Jerzierska and J.A. kozubowski, Jagiellonian University , Warsaw , Poland , 109-116 (1999)

  40. Keast, V. J. and Williams, D. B., “Quantification of Segregation Levels Using XEDS in the STEM” Microscopy and Microanalysis, eds. G.W. Bailey, W.G. Jerome, S. McKernan, J. F. Mansfield and R. L. Price, Springer, New York, NY, 5 , supplement 2, 146-147, (1999).

  41. Ito, Y., Jain, H. and Williams, D. B., “Analysis of Extended Energy-Loss Fine Structure of Nanometer-Scale Clusters” Microscopy and Microanalysis, eds. G.W. Bailey, W .G. Jerome, S. McKernan, J. F. Mansfield and R. L. Price, Springer, New York, NY, 5 , supplement 2, 708-709, (1999).

  42. Alamgir, F. M., Ito, Y., Williams, D. B. and Jain, H., “EXELFS as a Tool for Investigating the Local Structure of Bulk Glass-Forming Metal Alloys” Microscopy and Microanalysis, eds. G.W. Bailey, W. G. Jerome, S. McKernan, J. F. Mansfield and R. L. Price, Springer, New York, NY, 5 , supplement 2, 138-139, (1999).

  43. Watanabe, M. and. Williams, D. B., “ The New Form of the Zeta-Factor Method for Quantitative Microanalysis in the AEM-XEDS and its Evaluation” Microscopy and Microanalysis, eds. G.W. Bailey, W. G. Jerome, S. McKernan, J. F. Mansfield and R. L. Price, Springer, New York, NY, 5 , supplement 2, 88-89, (1999).

  44. Williams D. B. “A Brief History of IUMAS ” Microscopy and Microanalysis 5 , 68-69 (1999).

  45. Williams, D. B. and Watanabe, M. “Atomic Resolution X-ray Microanalysis in the Analytical Transmission Electron Microscope' Scanning, 21.2 , 94-95, (1999).

  46. Williams, D. B. “The Next Generation of TEMs” Microscopy Today, 99.3 , 33-35, (1999).

  47. Wiliams, D. B., The Impact of TEM Education on the Development of the Instrument” Microscopy Today, 99.2. 26-27, (1999).

  48. Williams, D. B. “Is the TEM Obsolete?” Microscopy Today, 99.1. 16-17 (1999).

  49. Ito, Y., Alamgir, F. M., Williams, D. B. and Jain, H “EXELFS of Metallic Glasses” Materials Research Society Proceedings, 672, (1998).

  50. Alamgir, F. M., Ito, Y., Williams, D. B. and Jain, H. “A Local Probe into the Atomic and Electronic Structure of Metallic Glasses Using EELS” Materials Research Society Proceedings, 671, (1998).

  51. Watanabe, M., Carpenter, D. T., Ackland, D. W. and Williams, D. B. “The z -factor Approach for Quantitative Composition and Thickness Mapping in AEM-XEDS” Electron Microscopy-1998, eds. H. A. Calderon Benavides and M. Jose Yacaman, Institute of Physics, Bristol , 3 , 565-566, (1998).

  52. Keast V. J. and Williams, D.B. “Application of High-Resolution X-ray Mapping to Grain Boundary Segregation” Electron Microscopy-1998, eds. H. A. Calderon Benavides and M. Jose Yacaman, Institute of Physics, Bristol , 2 , 569-570, (1998).

  53. Williams, D.B. Keast, V.J., Watanabe, M. and Carpenter, D. T. “Segregation to Interfaces in Metals and Alloys” Electron Microscopy-1998, eds. H. A. Calderon Benavides and M. Jose Yacaman, Institute of Physics, Bristol , 2 , 27-28, (1998).

  54. Watanabe, M. and Williams, D.B. “Quantitative Composition and Thickness Mapping with High Spatial Resolution by XEDS in a 300 kV FEG AEM” Microscopy and Microanalysis, eds. G. W. Bailey, K. B. Alexander, W. G. Jerome, M. G. Bond and J. J. McCarthy, Springer, New York, NY, 4 , supplement 2, 967-968, (1998).

  55. Williams D.B. and Goldstein J.I. “Electron Microscopy and Microanalysis of Metal Phases in Meteorites” Microscopy and Microanalysis, Microscopy and Microanalysis, eds. G. W. Bailey, K. B. Alexander, W. G. Jerome, M. G. Bond and J. J. McCarthy, Springer, New York, NY, 4 , supplement 2, 602-603, (1998).

  56. Williams, D.B. “The Impact of EDS on Materials Science Microanalysis” Microscopy and Microanalysis, eds. G. W. Bailey, K. B. Alexander, W. G. Jerome, M. G. Bond and J. J. McCarthy, Springer, New York, NY, 4 , supplement 2, 168-169, (1998).

  57. Watanabe, M. and Williams, D.B., “Quantitative Composition and Thickness Mapping with High Spatial Resolution by XEDS in a 300 kV FEG AEM” Annual Reports, HVEM Laboratory, Kyushu University , 22 , 31-32, (1998).

  58. Williams, D.B., Watanabe, M. and Keast, V.J. “Interface Analysis in the VG HB 603 300 keV STEM”. Frontiers of Electron Microcopy in Materials Science, Kloster Irsee , Germany (1998).

  59. Keast, V.J., Bruley, J., and Williams, D.B. “Investigations of the Bonding Changes Associated with Grain Boundary Embrittlement” Interfacial Engineering for Optimized Properties, Materials Research Society Symposium Proceedings v 458 1997. Materials Research Society, Pittsburgh, PA, 93-102

  60. Ito, Y., Jain, H. and Williams, D.B. “Application of EXELFS to Glasses in Dedicated STEMs”. Electron Microscopy and Analysis, Institute of Physics Conference Series No 153, Ed. J. M. Rodenburg, 311-314 (1997).

  61. Keast, V. J. and Williams, D.B. “Investigation of Grain Boundary Embrittlement in the STEM” Electron Microscopy and Analysis Institute of Physics Conference Series No 153, Ed. J. M. Rodenburg, 299-302 (1997).

  62. Watanabe, M., Carpenter, D. T. and Williams D. B. “Quantitative X-ray Mapping with High Spatial Resolution” Electron Microscopy and Analysis, Institute of Physics Conference Series No 153, Ed. J. M. Rodenburg, 295-298 (1997).

  63. Voelkl, E., Allard, L. F., Bruley J., Keast, V. J. and Williams D. B “The Teaching of TEM by Telepresence Microscopy over the Internet” Electron Microscopy and Analysis, Institute of Physics Conference Series No 153, Ed. J. M. Rodenburg, 45-48 (1997).

  64. Ito, Y., Winkler, D., Jain, H. and Williams, D.B. “Application of EXELFS for Determining the Structure of Amorphous SiO 2 ” Proc. 14th University Glass Conference, P-1, Lehigh University , (1997).

  65. Lucadamo, G., Watanabe, M., Barmak, K. and Williams, D. B. “High Resolution X-ray Microanalysis of Nb/Al Multilayer Thin Films” Microscopy and Microanalysis, eds. G. W. Bailey, R. V. W. Dimlich, K. B. Alexander, J. J. McCarthy and T. B. Pretlow, Springer, New York, NY, 3 , supplement 2, 967-968, (1997).

  66. Watanabe, M., Ackland, D. W. and Williams, D. B., “Practical Estimation of Analytical Sensitivity for EDS in an Intermediate Voltage-FEG STEM” Microscopy and Microanalysis, eds. G. W. Bailey, R. V. W. Dimlich, K. B. Alexander, J. J. McCarthy and T. B. Pretlow, Springer, New York, NY, 3 , supplement 2, 965-966, (1997).

  67. Voelkl, E., Allard, L. F., Bruley J., and Williams D. B. “(Under)graduate Teaching Using Internet Access to Electron Microscopes” Microscopy and Microanalysis eds. G. W. Bailey, R. V. W. Dimlich, K. B. Alexander, J. J. McCarthy and T. B. Pretlow, Springer, New York, NY, 3 , supplement 2, 1095-1096, (1997).

  68. Carpenter, D. T. and Williams D. B. “Quantification of Cu Segregation to Grain Boundaries in an Al-4 wt. % Cu Thin Film Using High-Resolution X-ray Mapping” Microscopy and Microanalysis, eds. G. W. Bailey, R. V. W. Dimlich, K. B. Alexander, J. J. McCarthy and T. B. Pretlow, Springer, New York, NY, 3 , supplement 2, 537-538, (1997).

  69. Repa, K. A. and Williams, D. B. “Optimization of the Production of a Chromium Thin-Film AEM Characterization Standard by Thermal Evaporation” Microscopy and Microanalysis, eds. G. W. Bailey, J. M. Corbett, R. V. W. Dimlich, J. R. Michael and N. J. Zaluzec, San Francisco Press, San Francisco, CA, 582-583, (1996).

  70. Bruley, J. and Williams, D. B. “Effect of Thickness Variations on EELS Spatial-Difference Profiles” Microscopy and Microanalysis, eds. G. W. Bailey, J. M. Corbett, R. V. W. Dimlich, J. R. Michael and N. J. Zaluzec, San Francisco Press, San Francisco, CA, 564-565, (1996).

  71. Winkler, D. C., Williams, D. B. and Jain, H. “EXELFS Study of the Structure of Silica and Sodium Silicate Glasses” Microscopy and Microanalysis, eds. G. W. Bailey, J. M. Corbett, R. V. W. Dimlich, J. R. Michael and N. J. Zaluzec, San Francisco Press, San Francisco , CA , 536-537, (1996).

  72. Keast, V. J., Bruley, J. and Williams, D. B. “STEM Investigation of the Chemistry and Bonding Changes Associated with the Grain Boundary Embrittlement of Cu by Bi” Microscopy and Microanalysis, eds. G. W. Bailey, J. M. Corbett, R. V. W. Dimlich, J. R. Michael and N. J. Zaluzec, San Francisco Press, San Francisco, CA, 526-527, (1996).

  73. Williams, D. B., Bruley, J., Keast, V. J., Goldstein, J. I. and Yang, C. W. “Analytical Electron Microscopy of Interfaces” Proc. 6th Beijing Conf. and Exhibition on Instrum. Analysis, Peking University Press, Beijing , A95-A96 (1995)

  74. Williams D. B. “A New Analytical Electron Microscope” Acta Microsc. 4B , 11, (1995).

  75. Bruley, J., Keast, V. J. and Williams, D. B., “EELS Fine Structure Studies of Interfaces,” Acta Microsc., 4B , 20, (1995).

  76. Williams, D. B. and Bruley, J. “Electron Energy-Loss Spectrometry (EELS) Imaging” Atti XX Congresso di Microscopica Elettronica Rimini , Universita di Bologna, 183-184 (1995).

  77. Williams, D. B. and Tseng, M. W. “Energy-Dispersive Spectrometry - Quantification and Imaging” Atti XX Congresso di Microscopica Elettronica Rimini, Universita di Bologna, 13-14 (1995).

  78. Yang, C-W, Williams, D. B. and Goldstein, J. I. “Thin-Foil Preparation for AEM Study of Small Metal Particles in Stony Meteorites” Microscopy & Microanalysis-95, eds. G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J. Zaluzec, Jones and Begell, Boston, MA, 510-511, (1995).

  79. Bruley, J., Williams, D. B. and Tseng, M. W. “Point-Defect Distributions in Ceramics by Spectrum-Line Profiling” Microscopy & Microanalysis-95, eds. G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J. Zaluzec, Jones and Begell, Boston, MA, 312-313, (1995).

  80. Bruley, J., Ackland, D. W., Fang, J. and Williams, D. B. “Interface Analysis in the VG Microscopes HB 603 300 keV STEM” Microscopy & Microanalysis-95, eds. G. W. Bailey, M. H. Ellisman, R. A. Hennigar and N. J. Zaluzec, Jones and Begell, Boston, MA, 286-287, (1995).

  81. Ma, L., Williams, D. B. and Goldstein, J. I. “X-ray Microanalysis of Fe-Rich Fe-Ni-S System at 900°C - 300°C” Microbeam Analysis-95, ed. E. Etz, VCH, New York, NY, 411-412 (1995).

  82. Bruley, J., Williams, D. B. and Keast, V. “Electron Energy-Loss Fine Structure Studies of Interfaces” Microbeam Analysis-95, ed. E. Etz, VCH, New York , NY , 293-294 (1995).

  83. Rej, D. J., Remnev, G. E., Davis, H. A., Isakov, I. F., Ivanov, Yu. F., Johnston, G. P., Matvienko, V. M., Nastasi, M., Olson, J. C., Potyomkin, A. V., Schmidt, H. K., Semukhin, B. S., Tallant, D. R., Thompson, M. O., Waganaar, W. J., Walter, K. C., Williams, D. B. and Zakoutayev, A. N. “Preparation of Diamond-Like Carbon and Boron Nitride Films by High Intensity Pulsed Ion Beam Deposition” Proc 3rd Int. Conf. on Applications of Diamond Films and Related Materials, NIST, (1995).

  84. Hunt, J. A. and Williams, D. B., “Interactive Multiple Area Spectrum Integration (MASI)”, Proc. 52nd MSA Meeting, ed. W. Bailey, 942-942, (1994).

  85. Tseng, M. W., Williams, D. B., Soni, K. K., and Bruley, J., “Microcharacterization of Superalloy/Sapphire Composites,” Microbeam Analysis, ed. J. Friel, 195-196 (1994).

  86. Williams, D. B., Hunt, J. A., and Soni, K. K., “Quantitative Imaging of Lithium in Aluminum-Lithium Alloys,” Proc. 4th Int. Conf. on Aluminum Alloys, eds. T. H. Sanders, Jr., and E. A. Starke, Jr., II , 137-144 (1994).

  87. Williams, D. B., “Modern Microstructural Analysis of Aluminum Alloys,” Proc. 4th Int. Conf. on Aluminum Alloys, eds. T. H. Sanders, Jr., and E. A. Starke, Jr., III , 50-66, (1994).

  88. Bruley, J., Williams, D. B., and Zhang, Z., “Interfacial Chemistry Between Diamond on Silicon, Grown by HF-CVD,” Electron Microscopy-1994, eds., B. Jouffrey and C. Colliex, Les Editions de Physique, F-91944, Les Ulis Cedex A. France, 1 , 653-654 (1994).

  89. Bruley, J., Williams, D. B., Cuomo, J. J. and Pappas, D. L., “Factors Affecting the Accuracy of a Quantitative Bonding Analysis of Diamond-like Carbon Films,” Electron Microscopy-1994, eds., B. Jouffrey and C. Colliex, Les Editions de Physique, F-91944, Les Ulis Cedex A. France, 1 , 635-636 (1994).

  90. Williams, D. B., “The Quantitative Analysis of Thin Specimens,” Proc. XIII International Congress on X-ray Optics and Microanalysis, Institute of Physics, Ser. 130 , 263-270 (1993) (invited).

  91. Lyman, C. E., Goldstein, J. I., Williams, D. B., Ackland, D. W., von Harrach, H. S., Nicholls, A. W., and Statham, P. J., “X-ray Detection Performance of a 300 kV Field Emission Analytical Electron Microscope,” Proc. EMAG Meeting, Institute of Physics, Bristol and London (1993).

  92. Lyman, C. E., Goldstein, J. I., Williams, D. B., Ackland, D. W., von Harrach, H. S., Nicholls, A. W. and Statham, P. J., “X-ray Detection Performance of a 300 kV Field Emission Analytical Electron Microscope,” Proc. 51st Annual MSA Meeting, ed. G. W. Bailey and C. L. Reider, San Francisco Press, San Francisco, CA 94142, 250-251 (1993).

  93. Hunt, J. A. and Williams, D. B., “Chemical Microanalysis Using EELS Fingerprinting,” Microbeam Analysis, 2 (Supplement) S280-S281 (1993).

  94. Hunt, J. A., Leapman, R. D., and Williams, D. B., “Low Dose EELS and Imaging Strategies in the STEM,” Microbeam Analysis, 2 (Supplement) S272-S273 (1993).

  95. Zemyan, S. and Williams, D. B., “K-Shell Ionization Cross Sections for Analytical Electron Microscopy,” Microbeam Analysis, 2 (Supplement) S244-S245 (1993).

  96. Zemyan, S. and Williams, D. B., “Variables in Calculated k-factors for Analytical Electron Microscopy,” Microbeam Analysis, 2 (Supplement) S242-S243 (1993).

  97. Williams, D. B., Goldstein, J. I., Lyman, C. E., Ackland, D. W., Von Harrach, S., and Statham, P. J., “A New Analytical Electron Microscope,” Microbeam Analysis, 2 (Supplement) S236-S237 (1993).

  98. Lyman, C. E., Goldstein, J. I., Williams, D. B., Ackland, D. W., Von Harrach, S., Nicholls, A. W., and Statham, P. J., “Improved X-ray Throughput by Fast Beam Blanking in a 300 kV Field Emission Analytical Electron Microscope,” Microbeam Analysis 2 (Supplement) S234-S235 (1993).

  99. Zemyan, S. and Williams, D. B., “Characterizing an Energy-Dispersive Spectrometer on an Analytical Electron Microscope,” Microbeam Analysis 2 (Supplement) S182-S183 (1993).

  100. Soni, K. K., Chabala, J. M., Levi-Setti, R., Tseng, M. W., and Williams, D. B., “SIMS Analysis of Aerospace Composite Materials,” Microbeam Analysis 2 (Supplement) S144-S145 (1993).

  101. Williams, D. B., “IFMAS, an Organization Whose Time has Come?” in Microbeam Analysis 2 (Supplement) S6 (1993).

  102. Williams, D. B., and Hunt, J. A., “Applications of Electron Energy-Loss Spectrum Imaging,” Electron Microscopy 1992, Proc. 12th EUREM, 1 , 243-246 (1992).

  103. Zhang, Z., Zhuang, Y., Geng, W., Williams, D. B., and Kuo, K. H., “A TEM Study of Crystalline Surface Layers on Quasicrystals,” Proc. 5th Asia-Pacific Electron Microscopy Conference, World Scientific Inc., Singapore , 490-493 (1992).

  104. Williams, D. B., and Hunt, J. A., “The Future of Electron Energy-Loss Spectrometry in the Analytical Electron Microscope,” Proc. 5th Asia-Pacific Electron Microscopy Meeting, 134-137, (1992).

  105. Soni, K. K., Thompson, A. M., Harmer, M. P., Williams, D. B., Chabala, J. M., and Levi-Setti, R., “SIMS Studies of Ca and Mg Distributions in Sintered Al 2 O 3 ,” Proc. 50th EMSA Meeting, ed. G. W. Bailey and J. Bentley, San Francisco Press, San Francisco, CA 94142-6800, 1772-1773 (1992).

  106. Hunt, J. A., and Williams, D. B., “EELS Detection Limits,” Proc. 27th MAS Meeting, ed. J. A. Small, San Francisco Press, San Francisco, CA 94142-6800, 1468-1469 (1992).

  107. Strutt, A. J., and Williams, D. B., “Parallel Electron Energy Loss Spectroscopy of a Cu-Be Alloy,” Proc. 27th MAS Meeting, ed. J. A. Small, San Francisco Press, San Francisco, CA 94142-6800, 1252-1253 (1992).

  108. Zemyan, S. M. and Williams, D. B., “Peak-To-Background Measurements on a 300 kV TEM/STEM,” Proc. 27th MAS Meeting, ed. J. A. Small, San Francisco Press, San Francisco, CA 94142-6800, 1236-1237 (1992).

  109. Hunt, J. A. and Williams, D. B., “The Current State of Spectrum Imaging,” Proc. 50th EMSA Meeting, ed. G. W. Bailey and J. Bentley, San Francisco Press, San Francisco, CA 94142-6800, 1200-1201 (1992).

  110. Williams, D. B., “Aluminum-Lithium Alloys: A Solution Looking for a Problem?” Proc. 50th EMSA Meeting, ed. G. W. Bailey and J. Bentley, San Francisco Press, San Francisco, CA 94142-6800, 182-183 (1992).

  111. Zemyan, S. M., and Williams, D. B., “X-ray Microanalysis of Heavy Elements by Use of L and K Series Lines,” Microbeam Analysis-1991, ed. D. G. Howitt, San Francisco Press, San Francisco, CA 94101 (1991).

  112. Zhang, J., Williams, D. B., and Goldstein, J. I., “Practical Importance of Spatial Resolution and Analytical Sensitivity in AEM X-ray Microanalysis,” Microbeam Analysis-1990, ed. J. R. Michael and P. Ingram, San Francisco Press, San Francisco, CA 94101, 307-310 (1991).

  113. Hunt, J. A., Strutt, A. J. and Williams, D. B., “Quantitative Light Element Analysis Using PEELS,” Proc. 49th EMSA Meeting, ed. E. L. Hall, San Francisco Press, San Francisco, CA 94101 (1991).

  114. Williams, D. B., Michael, J. R., Goldstein, J. I., and Romig, A. D. Jr., “The Spatial Resolution of X-ray Microanalysis in Thin Foils,” Proc. 49th EMSA Meeting, ed. E. L. Hall, San Francisco Press, San Francisco , CA 94101 , (1991).

  115. Soni, K. K., Williams, D. B., Chabala, J. M., Levi-Setti, R., and Newbury, D. E., “Imaging of Al-Li-Cu Alloys with a Scanning Ion Microprobe,” Microbeam Analysis-1990, ed. J. R. Michael and P. Ingram, San Francisco Press, San Francisco, CA 94101, 103-108 (1990).

  116. Zhang, J., Williams, D. B., and Goldstein, J. I., “Practical Importance of Spatial Resolution and Analytical Sensitivity in AEM X-ray Microanalysis,” Electron Microscopy-1990, ed. L. D. Peachey and D. B. Williams, San Francisco Press, San Francisco, CA 94101, 2 , 432-433 (1990).

  117. Liu, G. K., Guan, Z. M., Williams, D. B., and Notis, M. R., “A Study of DIGM in Ag/Cu System by AEM,” Electron-Microscopy-1990, ed. L. D. Peachey and D. B. Williams, San Francisco Press, San Francisco, CA 94101, 2 , 416-417 (1990).

  118. Soni, K. K., Williams, D. B., Chabala, J. M., Levi-Setti, R., and Newbury, D. E., “Imaging of Al-Li-Cu Alloys With A Scanning Ion Microprobe,” Electron Microscopy-1990, ed. L. D. Peachey and D. B. Williams, San Francisco Press, San Francisco, CA 94101, 2 , 314-315 (1990).

  119. Williams, D. B. and Zemyan, S. M., “Microanalysis at Intermediate Voltages,” Electron Microscopy-1990, ed. L. D. Peachey and D. B. Williams, San Francisco Press, San Francisco, CA 94101, 1 , 480-481 (1990).

  120. Williams, D. B., Levi-Setti, R., Chabala, J. M., Wang, Y. L., Newbury, D. E. and Soni, K. K., “SIMS Studies of Binary Al-Li Alloys” Aluminum-Lithium V, ed. T. H. Sanders, Jr. and E. A. Starke, Jr., Materials and Component Engineering Publications Ltd., Birmingham, U.K., 605-612 (1989).

  121. Williams, D. B. “The Binary Aluminum-Lithium Phase Diagram,” Aluminum-Lithium V, ed. T. H. Sanders, Jr. and E. A. Starke Jr., Materials and Component Engineering Publications Ltd., Birmingham , U.K. , 551-563 (1989).

  122. Lyman, C. E., Ackland, D. W., Williams, D. B. and Goldstein, J. I., “The Hole-Count Test Revisited: Effects of Test Specimen Thickness,” Microbeam Analysis-1989, ed. P. E. Russell, San Francisco Press, 507-510 (1989).

  123. Goldstein, J. I. and Williams, D. B., “Effect of Foil Thickness on Quantification of EDS Spectra,” Microbeam Analysis-1989, ed. P. E. Russell, San Francisco Press, 501-506 (1989).

  124. Liu. D. R. and Williams, D. B., “Secondary Electron Imaging of YBa 2 Cu 3 O 7-x High T c Superconductors in Scanning Transmission Electron Microscope,” Proc. 47th EMSA Meeting, ed. G. W. Bailey, San Francisco Press, 684-685 (1989).

  125. Liu, D. R. and Williams, D. B., “Some Practical Aspects of CBED Applications in Materials Science,” Proc. 47th EMSA Meeting, ed. G. W. Bailey, San Francisco Press, 508-509, invited review (1989).

  126. Williams, D. B., “Microchemical Characterization of Alloys Containing Lithium and Beryllium,” Proc. 5th Scandinavian Symposium on Materials Science, 737-744 (1989).

  127. Williams, D. B., “Interfacial Segregation Studies in the Analytical Electron Microscope,” Proc. VIII Congreso Nacional de Fisica de Superficies e Interfaces, Sociedad Mexicana de Ciencia de Superficies y Vacio, A.C., 29-36 (1988).

  128. Liu, D-R., Wall, M. and Williams, D. B., “EELS Microanalysis of Be-Ti Alloys with Calibrated Partial Cross Sections,” Microbeam Analysis-1988, ed. D. E. Newbury, San Francisco Press, 91-92 (1988).

  129. Liu, D-R., Wall, M. and Williams, D. B., “Possible Ambiguity in the Structural Analysis of TiBe 2 by Convergent Beam Electron Diffraction,” Microbeam Analysis-1988, ed. D. E. Newbury , San Francisco Press, 87-90 (1988).

  130. Kowalik, J. A., Goldstein, J. I. and Williams, D. B., “Formation of the Lamellar Morphology in the Dayton Iron Meteorite,” Phase Transformations-'87, ed. G. W. Lorimer, The Institute of Metals, 519-521 (1988).

  131. Sung, C. M., Harmer, M. P., Smyth, D. M. and Williams, D. B., “Microstructure of the Superconducting Phase (85K) in the Bi-Sr-Ca-Cu-O System,” Proc. 46th EMSA Meeting, ed. G. W. Bailey, San Francisco Press, 876-877 (1988).

  132. Liu, D-R. and Williams, D. B., “Thickness Dependence of the Intensities of the {200} Forbidden Reflections in the TiBe 2 Diamond Type Structure,” Proc. 46th EMSA Meeting, ed. G. W. Bailey, San Francisco Press, 826-827 (1988).

  133. Williams, D. B. and Romig Jr., A. D., “Measurement of Solute Segregation to Grain Boundaries in the AEM: A Review,” Proc. 46th EMSA Meeting, ed. G. W. Bailey, San Francisco Press, 606-607 (1988).

  134. Williams, D. B., “Towards the Limits of Microanalysis in the Analytical Electron Microscope,” Electron Microscopy and Analysis 1987 (Analytical Electron Microscopy Workshop) ed. G. W. Lorimer, The Institute of Physics, Bristol and London, 1-6 (1987).

  135. Goldstein, J. I., Williams, D. B. and Lyman, C. E., “Quantitative X-ray Microanalysis in the Analytical Electron Microscope,” Proc. 2nd Beijing Conf. and Exhib. on Instrum. Analysis, 7-8 (1987).

  136. Vecchio, K. S. and Williams, D. B., “CBED and Microanalysis Evidence for the Non-Icosahedral T 2 (Al 6 Li 3 Cu) Phase,” Analytical Electron Microscopy-1987, ed. D. C. Joy, San Francisco Press, 129-131 (1987).

  137. Klein, C. F., Williams, D. B. and Ayer, R., “The Effect of Electron Gun Characteristics on Probe Size and Gun Brightness in Analytical Electron Microscopy,” Analytical Electron Microscopy-1987, ed. D. C. Joy, San Francisco Press, 103-105 (1987).

  138. Liu, D.-R. and Williams, D. B., “Quantification of the Li Content of Al 3 (Zr,Li) Particles by Electron Energy Loss Spectroscopy,” Analytical Electron Microscopy-1987, ed. D. C. Joy, San Francisco Press, 288-290 (1987).

  139. Liu, D.-R. and Williams, D. B., “Spatial Resolution Limitations of Electron Energy Loss Spectra Collected in the TEM Mode,” Analytical Electron Microscopy-1987, ed. D. C. Joy, San Francisco Press, 280-282 (1987).

  140. Michael, J. R. and Williams, D. B., “Determination of Migrating Grain Boundary Diffusion Coefficients in Al-4.7 wt. % Cu,” Analytical Electron Microscopy-1987, ed. D. C. Joy, San Francisco Press, 249-251 (1987).

  141. Williams, D. B. and Steel, E. B., “A Standard Cr Thin Film Specimen to Measure the X-ray Peak to Background Ratio (Using the Fiori Definition) in Analytical Electron Microscopes,” Analytical Electron Microscopy-1987, ed. D. C. Joy, San Francisco Press, 228-230 (1987).

  142. Sung, C. M. and Williams, D. B., “Convergent Beam Electron Diffraction Studies of the Strain Field Around a Dislocation,” Analytical Electron Microscopy-1987, ed. D. C. Joy, San Francisco Press, 169-172 (1987).

  143. Guan, Z. M., Liu, K. H., Notis, M. R. and Williams, D. B., “X-ray Microanalysis of Solute Redistribution During Diffusion-Induced Grain Boundary Migration,” Analytical Electron Microscopy-1987, ed. D. C. Joy, San Francisco Press, 19-20 (1987).

  144. Williams, D. B., “Progress in X-ray Microanalysis in the Analytical Electron Microscope,” Electron Microscopy Society of Southern Africa , 17 , 5-8 (1987). Invited Paper.

  145. Reuter, K. B., Williams, D. B. and Goldstein, J. I., “Evidence for Ordered Fe 3 Ni,” Proc. 45th EMSA Meeting, ed. G. W. Bailey, San Francisco Press, 216-217 (1987).

  146. Sung, C. M. and Williams, D. B., “The Usefulness of High Index Low Symmetry Zone Axes for HOLZ Line Analysis,” Proc. 45th EMSA Meeting, ed. G. W. Bailey, San Francisco Press, 384-385 (1987).

  147. Liu, D.-R. and Williams, D. B., “A New Background Extrapolation Procedure for Quantification in EELS,” Proc. 45th EMSA Meeting, ed. G. W. Bailey, San Francisco Press, 118-119 (1987).

  148. Vecchio, K. S. and Williams, D. B., “Microtwinning Evidence for the Apparent Five-Fold Symmetry in T 2 (Al 6 Li 3 Cu),” Proc. 45th EMSA Meeting, ed. G. W. Bailey, San Francisco Press, 24-25 (1987).

  149. Liu, D.-R. and Williams, D. B., “Study of Lithium in the Analytical Electron Microscope,” Proc. First Beijing Symposium on Electron Microscopy, The Chinese Electron Microscope Society, p. 64 (1986).

  150. Williams, D. B., “The Application of Analytical Electron Microscopy to Materials,” Proc. First Beijing Symposium on Electron Microscopy, The Chinese Electron Microscope Society, p. 7 (1986). Invited Paper.

  151. Williams, D. B., “Standardized Definitions of X-ray Analysis Performance Criteria in the AEM,” Microbeam Analysis-1986, eds. A. D. Romig, Jr. and W. F. Chambers, San Francisco Press, 443-448 (1986).

  152. Liu, D-R. and Williams, D. B., “Progress Towards Precise Composition Determination of Al-Li Alloys by Electron-Energy-Loss Spectroscopy,” Microbeam Analysis-1986, eds. A. D. Romig, Jr. and W. F. Chambers, San Francisco Press, 425-428 (1986).

  153. Horvath, S., Harmer, M. P., Notis, M. R. and Williams, D. B., “Analytical Electron Microscopy of Precipitation in the Y 2 O 3 -La 2 O 3 System,” Proc. XIth Int. Cong. on Electron Microscopy, Japanese Society of Electron Microscopy, Tokyo, Japan, 2 , 1659-1660 (1986).

  154. Reuter, K. B., Kowalik, J. A., Williams, D. B. and Goldstein, J. I., “Combined Analytical and High Voltage Electron Microscopy of the Dayton Iron Meteorite,” Proc. XIth Int. Cong. on Electron Microscopy, Japanese Society of Electron Microscopy, Tokyo, Japan, 2 , 1067-1068 (1986).

  155. Klein, C. F., Ayer, R. and Williams, D. B., “The Effect of Accelerating Voltage and Electron Source Brightness on the Spatial Resolution of X-ray Microanalysis,” Proc. XIth Int. Cong. on Electron Microscopy, The Japanese Society of Electron Microscopy, Tokyo, Japan, 1 , 543-544 (1986).

  156. Williams, D. B., “Principles and Application of Quantitative X-ray Energy Dispersive Spectrometry in the Analytical Electron Microscope,” Proc. XIth Int. Cong. on Electron Microscopy, The Japanese Society of Electron Microscopy, Tokyo, Japan 1 , 45-48 (1986). Invited Paper.

  157. Goldstein, J. I., Williams, D. B. and Lyman, C. E., “Quantitative High Resolution Microanalysis of Materials in the Analytical Electron Microscope,” Proc. lst Beijing Conference and Exhibition on Instrumental Analysis (1985).

  158. Stimson, W., Tosten, M. H., Howell, P. R. and Williams, D. B., “Precipitation and Lithium Segregation Studies in Al-1.8% Li-0.1% Zr,” in Aluminum-Lithium Alloys III, eds. C. Baker, P. J. Gregson, S. J. Harris and C. J. Peel, The Institute of Metals, London, 386-391 (1986).

  159. Sung, C. M., Chan, H. M. and Williams, D. B., “Quantitative Microanalysis of Li in Binary Al-Li Alloys,” in Aluminum-Lithium Alloys III, eds. C. Baker, P. J. Gregson, S. J. Harris and C. J. Peel, The Institute of Metals, London, 337-346 (1986).

  160. Spooner, S. and Williams, D. B., “Combined Small Angle X-ray Scattering Studies of Al-Li Binary Alloys,” in Aluminum-Lithium Alloys III, eds. C. Baker, P. J. Gregson, S. J. Harris and C. J. Peel, The Institute of Metals, London, 329-336 (1986).

  161. Williams, D. B., “Recent Advances in Analytical Electron Microscopy” Proc. lst Japan AEM Conference, Tokyo , ed. Y. Bando , Japan Electron Microscope Society, 72-77 (1985). Invited Paper.

  162. Klein, C. F., Ayer, R. and Williams, D. B., “Comparison of Methods for Quantitative Thin Film X-ray Microanalysis from Strongly Overlapping Peaks,” in Microbeam Analysis-1985, ed. J. T. Armstrong, San Francisco Press, 357-360 (1985).

  163. Goldstein, J. I., Williams, D. B. and Reuter, K. B., “Analytical Electron Microscopy and Microbeam Analysis of Metallic Phases in Extraterrestrial Materials,” in Microbeam Analysis-1985, ed. J. T. Armstrong, San Francisco Press, 259-265 (1985).

  164. Newbury, D. E., Bright, D. S., Williams, D. B., Sung, C. M., Page, T. F. and Ness, J., “Application of Digital SIMS Imaging to Light Element and Trace Element Mapping,” Proc. SIMS V, Springer Verlag Series in Chemical Physics, Springer-Verlag, Berlin (1985).

  165. Goldstein, J. I., Williams, D. B. and Notis, M. R., “Application of Analytical Electron Microscopy to Materials,” Proc. Second Israel Materials Engineering Conference, eds. A. Grill and S. I. Rokhlin, 63-66 (1985).

  166. Michael, J. R. and Williams, D. B., “The Effect of Surface Layers on Composition Profile Studies in Al-4% Cu,” Analytical Electron Microscopy-1984, eds. D. B. Williams and D. C. Joy, San Francisco Press, 61-63 (1984).

  167. Newbury, D. E., Williams, D. B., Goldstein, J. I. and Fiori, C. E., “Observations on the Calculation of k AB Factors for Analytical Electron Microscopy,” Analytical Electron Microscopy-1984, eds. D. B. Williams and D. C. Joy, San Francisco Press, 276-278 (1984).

  168. Chan, H. M., Piscopo, I., Williams, D. B. and Notis, M. R., “AEM Study of the CaZrO 3 /ZrO 2 (ss) Eutectic: A Comparison Between EELS and UTW X-ray EDS,” Analytical Electron Microscopy-1984, eds. D. B. Williams and D. C. Joy, San Francisco Press, 363-368 (1984).

  169. Reuter, K. B., Williams, D. B.. and Goldstein, J. I., “Microanalysis and Microdiffraction of Two-Phase Regions in the Metallic Phase of the Estherville Meteorite,” Analytical Electron Microscopy-1984, eds. D. B. Williams and D. C. Joy, San Francisco Press, 177-181 (1984).

  170. Dias, R., Pense, A. W. and Williams, D. B., “Microanalysis of Second Phase Particles in Nuclear Pressure Vessel Welds,” Analytical Electron Microscopy-1984, ed. D. B. Williams and D. C. Joy, San Francisco Press, 161-164 (1984).

  171. Baumann, S. F. and Williams, D. B., “The Effect of Ternary Additions on the d '/ a Misfit and the d ' Solvus Line in Al-Li Alloys,” in Aluminum-Lithium Alloys II, eds. E. A. Starke, Jr. and T. H. Sanders, Jr., TMS-AIME, Warrendale, PA 17-29 (1984).

  172. Butler, S. R., Tsai, H. L., Williams, D. B. and Sheu, Y. D., “Chlorine Incorporation and Third Phase Development at the SiO 2 /Si Interface During the Oxidation of Silicon in O 2 -HCl Ambients,” in Insulating Films on Semiconductors, eds. J. F. Vermeij and D. R. Wolters, Elsevier Science Publishers B.V. (North Holland) Amsterdam, 47-50 (1983).

  173. Williams, D. B., Goldstein, J. I. and Michael, J. R., “Quantification of Energy Dispersive X-ray Spectra from Thin Foil Specimens,” Microbeam Analysis Society-1982, ed. K. F. J. Heinrich, 21-36 (1982).

  174. Tsai, H. L., Gale, P. O., Williams, D. B. and Butler , S. R., “Cl Incorporation at the Si/SiO 2 Interface During the Oxidation of Si in HCl/O 2 Ambients,” The Electrochemical Society Extended Abstracts, 82 -2, 317-318 (1982).

  175. Tsai, H. L., Williams, D. B., Butler , S. R. and Feigl, F. J., “Cl-Rich Phase Development and Cl Segregation at the Si/SiO 2 Interface During HCl Oxidation of Silicon,” The Electrochemical Society Extended Abstracts, 82 -2, 315-316 (1982).

  176. Baumann, S. F. and Williams, D. B., “Morphology of d ' in Dilute Al-Li Alloys,” Proc. 40th EMSA Meeting, ed. G. W. Bailey, Claitors Publishing Division, 720-721 (1982).

  177. Williams, D. B. and Goldstein, J. I., “Absorption Effects in Quantitative Thin Film X-ray Microanalysis,” Analytical Electron Microscopy-1981, ed. R. H. Geiss, San Francisco Press, 39-46 (1981).

  178. Goldstein, J. I. and Williams, D. B., “Overview of Quantitative Compositional X-ray Analysis by AEM,” Analytical Electron Microscopy-1981, ed. R. H. Geiss, San Francisco Press, 11-16 (1981).

  179. Glitz, R. W., Notis, M. R., Williams, D. B. and Goldstein, J. I., “Considerations of X-ray Absorption for STEM X-ray Microanalysis of Ni-Al Foils,” Microbeam Analysis-1981, ed. R. H. Geiss, San Francisco Press, 309-312 (1981).

  180. Michael, J. R. and Williams, D. B., “Grain Boundary Segregation of Bismuth in Copper,” Proc. 39th EMSA Meeting, ed. G. W. Bailey, Claitors Publishing Division, 286-287 (1981).

  181. Porter, J. R., Goldstein, J. I. and Williams, D. B., “Analytical Electron Microscopy Characterization of Electric Furnace Dust,” Proc. 39th EMSA Meeting, ed. G. W. Bailey, Claitors Publishing Division, 134-135 (1981).

  182. Michael, J., Norian, K. H., Williams, D. B. and Edington, J. W., “STEM and CTEM Studies of the CdS Layer of Thin Solar Film Cells,” Proc. 7th European Congress on Electron Microscopy, Pub. 7th European Congress on Electron Microscopy Foundation, Leiden , 1 , 352-353 (1980).

  183. Baumann, S. F. and Williams, D. B., “Suppression of the Discontinuous Reaction in Cu-Be Alloys,” Proc. 7th European Congress on Electron Microscopy,” Pub. 7th European Congress on Electron Microscopy Foundation, Leiden , 1 , 194-195 (1980).

  184. Sankar, J. and Williams, D. B., “The Effect of Microstructure and Microchemistry on the Notch Toughness Behavior of Pressure Vessel Steel Weldments,” Proc. 7th European Congress on Electron Microscopy, Pub. 7th European Congress on Electron Microscopy Foundation, Leiden , 1 , 172-173 (1980).

  185. Williams, D. B., “Interfacial Solute Segregation Observed Using X-ray Microanalysis in the TEM/STEM,” Proc. 38th EMSA Meeting, ed. G. W. Bailey, Claitors Publishing Division, 352-355 (1980). Invited Paper.

  186. Williams, D. B., “Considerations of the Current Potential and Limits of Analytical Electron Microscopy,” Proc. 38th EMSA Meeting, ed. G. W. Bailey, Claitors Publishing Division, 82-85 (1980). Invited Paper.

  187. Williams, D. B., “Quantitative Metallurgical Applications of Plasmon Energy Loss Microanalysis,” Proc. 8th Int. Cong. on X-ray Optics and Microanalysis, eds. D. R. Beaman, R. E. Ogilvie and D. B. Wittry, Pendell Publishing Company, Midland, MI, 195-200 (1980).

  188. Mehta, S., Goldstein, J. I., Williams, D. B. and Romig, A. D., “Determination of the Cliff-Lorimer k Calibration Factors for Thin Foil X-ray Microanalysis of Na, Mg and Al in STEM” Microbeam Analysis-1979, ed. D. E. Newbury, San Francisco Press, San Francisco, CA, 119-123 (1979).

  189. Baumann, S. F. and Williams, D. B., “Effect of Ternary Additions on the Discontinuous Reaction in Cu-Be Alloys,” Proc. 37th EMSA Meeting, ed. G. W. Bailey, Claitors, Baton Rouge, LA,, 646-647 (1979).

  190. Williams, D. B., “A TEM/STEM Investigation of the Microstructure of Mild Steel Weld Metals,” Proc. 37th EMSA Meeting, ed. G. W. Bailey, Claitors, Baton Rouge, LA,, 476-477 (1979).

  191. Goldstein, J. I., Williams, D. B. and Romig, A. D., “Spatial Resolution in STEM X-ray Microanalysis--Experimental Measurements in Ferrous Materials” Proc. of Specialist Workshop on Analytical Electron Microscopy, Cornell University , 166-169 (1978).

  192. Williams, D. B. and Goldstein, J. I., “Minimization of System Produced X-ray Counts in a Philips EM300 TEM/STEM” Proc. of Specialist Workshop on Analytical Electron Microscopy, Cornell University, 174-178 (1978).

  193. Monkowski, J., Tressler, R. E., Stach, J., Rohatgi, A., Williams, D. B. and Butler, S. R., “Inhomogeneous Chlorine Distributions in Silicon Oxides Grown in HCl/O 2 Mixtures,” The Electrochemical Society, Fall Meeting 1978, Pittsburgh, PA, Extended Abstracts, 78 , 2 #211 (1978).

  194. Williams, D. B. and Goldstein, J. I., “STEM/X-ray Microanalysis Across a/g Interfaces in Fe-Ni Meteorites” Proc. 9th Int. Cong. on Electron Microscopy, Microscopical Society of Canada , Toronto , 1 , 416-417 (1978).

  195. Williams, D. B., “Analytical TEM of the Discontinuous Reactions in Cu-Be-Co Alloys” Proc. 9th Int. Cong. on Electron Microscopy, Microscopical Society of Canada, Toronto, 1 , 506-507 (1978).

  196. Williams, D. B., “Quantitative Metallurgical Applications of Plasmon Energy Loss Microanalysis” Proc. 35th EMSA Meeting, ed. G. W. Bailey, Claitors, Baton Rouge, LA, 248-249 (1977).

  197. Porter, D. A., Edington, J. W. and Williams, D. B., “Microanalysis Associated with Discontinuous Precipitation Reactions” Proc. 6th European Congress on Electron Microscopy, TAL International, Jerusalem , Vol. 1, 424-426 (1976).

  198. Williams, D. B. and Edington, J. W., “High Resolution Microanalysis and Microstructural Characteristics of Splat Quenched Aluminum-Copper Alloys”, Proc. 2nd Int. Conf. on Rapidly Quenched Metals, MIT Press, Cambridge, MA, USA, I , 135-142 (1975).

  199. Porter, D. A., Williams, D. B. and Edington, J. W., “Solute Concentration Profiles Associated with Discontinuous Precipitation in Mg-Al Alloys” Proc. 8th Int. Cong. on Electron Microscopy, Australian Academy of Science, Canberra, 1 , 656-657 (1974).

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