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David B. Williams

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Phone: (610) 758-6120

Email: dbw1@lehigh.edu

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David B. Williams is the Harold Chambers Senior Professor of Materials Science and Engineering and Vice Provost for Research at Lehigh University. He obtained his B.A. (1970), M.A. (1974), Ph.D. (1974) and Sc.D. (2001) from Cambridge University. From 1974-1976 he was a Science Research Council Fellow in the Department of Metallurgy and Materials Science in Cambridge. In 1976 he moved to Lehigh as an Assistant Professor of Materials Science and Engineering, becoming Associate Professor in 1979 and Professor in 1983. He directed the Electron Microscope Center at Lehigh from 1980 to 1998 and chaired the MS&E Department from 1992-2000 . He is also the Director of Lehigh University's renowned Electron Microscopy School which have been the world leader in microscopy education for more than 30 years.

He has co-authored and edited 11 textbooks and conference proceedings, including the best selling Transmission Electron Microscopy - a Text for Materials Science, Plenum Press 1996 (co-authored with Professor C. Barry Carter at the University of Minnesota. He is the author or co-author of 210 refereed publications and 190 abstract/conference publications in the general areas of analytical and transmission electron microscopy and the application of these techniques to studies of precipitation and segregation He has given more than 250 invited presentations at universities, research laboratories and conferences in 26 countries. He is a Fellow of TMS, ASM International and the Royal Microscopical Society (UK). Currently he is an Editor of Acta Materialia , and a member of several editorial boards. He is Past President of the International Union of Microbeam Analysis Societies and the US Microbeam Analysis Society . His research is in the areas of microstructural and microchemical characterization of materials using electron beams. He is particularly interested in the atomic-level segregation of elements and their effects on the properties of alloys. In combination with his research group has developed high-resolution microanalysis techniques using X-ray spectrometry and electron energy-loss spectrometry and applied them to materials as diverse as Al-base aerospace alloys, low allow steels for nuclear propulsion reactors, iron meteorites, glasses, and Ni-base superalloy/sapphire composites.

Links:
My book
Microbeam Analysis Society
Acta Materialia
Lehigh Microscopy School
Lehigh Microscopy Center
Center for Advanced Materials and Nanotechnology