Electron Microscopy

Scanning Transmission Electron Microscopes

• Vacuum Generators HB 603 -This Cs-corrected microscope with cold field emission is probably the most powerful instrument in the world for EDS analysis
• Vacuum Generators HB 501
  
  

Transmission Electron Microscopes

• JEOL 2200FS - A Schottky field-emission source, Cs correction, and an in-column energy filter make this an outstanding analytical microscope.
• JEOL 2000FX
  

Scanning Electron Microscopes

• Hitachi S-4300 SEN - Schottky source, EBSD, EDS, Variable pressure
• FEI XL30 ESEM - Environmental operation, EBSD, EDS
• JEOL 6400CL - Cathodoluminescence
• JEOL 733 - Microprobe with updated computer system

Focused Ion Beam Equipment

• FEI Strata DB 235 -Dual-beam FIB with EBSD and EDS