Strategies for Nanocharacterization

(MAT 397/497, MWF 9:10-10:10)

Lectures describe various nanocharacterization techniques in terms of which technique is best for specific measurements. Special attention paid to spatial resolution and detection limits for SEM, TEM, X-ray analysis, diffraction analysis, ion beam techniques, surface techniques, AFM and other SPMs, and light microscopies and spectroscopies.