Electron Microscopy (Lehigh Microscopy Center)

• Hitachi 4300 Cold Field Emission High Resolution Scanning Electron Microscope
  suitable for low-voltage operation, quantitative image analysis, and qualitative light element chemical analysis via EDS
  
  
• JEOL 733 Microprobe
  equipped with an EDS detector and four WDS detectors for quantitative chemical analysis
  
  
• FEI DB235 Focused Ion Beam (FIB) Milling System
  capable of preparing electron-transparent TEM samples from specific regions of the microstructure; replaces the labor and time intensive manual TEM sample preparation methods
  
  
• JEOL 2000FX and Philips EM 400T Transmission Electron Microscope
  for imaging of fine structures
  
  
• JEOL 2200 Field Emission Transmission Electron Microscope
  equipped with Cs corrector
  

• Two field emission dedicated STEMs
  • VG HB 603 300kV with two EDS systems
  • VG HB 501
    
    
• Philips XL-30 Scanning Electron Microscope
  equipped with Evex EDS system and TSL EBSD system
  

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Light Optical Microscopy and Mechanical Testing

• Reichert, Ziess, and Olympus Light Optical Metallographs
  
  
• LECO 3001 System for Computerized Quantitative Image Analysis
  
  
• LECO Microhardness Tester
  
  
• Manual, automatic, vibratory, and electrolytic polishing polishing equipment
  

• In-situ polishing equipment - manual and electrolytic
  
  
• INSTRON Frames equipped with FTA software for tensile, fracture toughness, and fatigue crack growth testing
  
  
• MTS Charpy Impact Tester
  

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