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A new paper by Professor Baltrusaitis et al. published in Applied Surface Science

Spectroscopy is a study of light interaction with any matter and provides information necessary to characterize any material properties and understand how those materials function.

A new paper by Professor Baltrusaitis et al. published in Applied Surface Science discusses a newly developed XPS spectral feature interpretation method for data processing without applying conventional peak fitting. XPS (X-ray Photoelectron Spectroscopy) is of wide application in many areas of fundamental science and engineering where chemical speciation of the surfacemost layers is required, including heterogeneous catalysis and materials science.

The obtained spectra information is complex and often is guided by the bias of the data processing scientist. Baltrusaitis et al. with a international team of scientists developed a vector based methods that removes in bias and utilizes changes in material in situ. Molybdenum oxide, complex material used in heterogeneous chemistry and catalysis, photo- and electrocatalysis, batteries, supercapacitors, sensors, as well as photovoltaic and electro- and photochromic applications, was used as an example.

XPS spectral data, obtained from series of molybdenum oxide samples with varying oxidation states and degree of crystallinity, were processed using this method and the corresponding oxidation states present, as well as their relative distribution was elucidated. The informed amorphous sample model (IASM) developed can be used for any complex sample and is implemented in CasaXPS, a widely used XPS data processing software.

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J Baltrusaitis

Professor Baltrusaitis' work is published in "Applied Surface Science", Volume 326, January 30, 2015, pp 151-161

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