Within Lehigh's project, CREF: Acquisition of confocal Raman imaging microscope for mapping materials spectroscopic signatures with sub- micrometer resolution, Slava V. Rotkin and a group of 13 faculty across several science and engineering disciplines acquired a new instrument: the Witec alpha300RA, a combined confocal Raman and Fluorescence Zeiss microscope setup with an in-situ scanning probe microscope.
Customized configuration allows hyper-spectral imaging of submicrometer features in nanomaterials and nanofabricated samples in visible and/or near-IR spectral range – that is, to perform “multi-color” Raman, or photoluminescence (PL) mapping of the samples, revealing chemical content and electronic properties at the single pixel level (down to the focal spot size). Using a scanning probe, AFM image can be superimposed on the hyper- spectral map.
The system includes two dedicated spectrometers (f=300 mm) which allows taking single point spectra, as well as imaging by acquiring line scans or maps in Raman (100-3500 1/cm) and vis-PL (400- 1050 nm) spectral range (with a specialized Si low-noise high pixel array camera). Additionally, the same point/line/2D hyper-spectral imaging is available in NIR-PL (800-1700 nm) spectral range (with a second InGaAs detector). The system is equipped with a specialized motion stage allowing the high-speed acquisition of large Raman/PL/NIR-PL maps in 3D (50 mm-50 mm-30 mm range with 100 nm step) and high-precision piezo-stage (85 um-85 um-50 um range with 0.1 nm step) for high-resolution imaging of smaller area/volume.
The system features two laser sources for both visible and NIR excitation (532 and 785 nm). It allows standard bright (10x, 20x and 100x) and dark field (50x) microscopy (upright).
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