Analytical Electron Microscopy
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The Vacuum Generators HB 603 Scanning Transmission
Electron Microscope. This unique dedicated STEM operates
up to 300kV. It is equipped with two EDS systems: one with
a standard Si(Li) detector and one with an intrinsic Ge detector.
Configured with an optimum geometry and large solid angles
of collection. This makes our instrument the world leader
for high resolution EDS and EELS analysis.
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STEM-XEDS
elemental maps from Au-Ag core-shell nanoparticles.
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This
AEM
micrograph shows a nanostructure X-ray
map of Yttrium segregation to grain boundaries in
a Y-doped ZrO2 ceramic. The field of view is 300 x
300 nm^2
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STEM-ADF image
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Ag map (Ag La)
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Au map (Au La)
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| Surface
Chemical Analysis |
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The
angle resolved XPS Scienta ESCA-300 is
a unique high resolution, high sensitivity instrument for analysis
of the nanochemistry of surfaces. The Scienta has a rotating
anode and monochromatized electron gun with a low energy electron
diffraction/residual gas analyzer. It operates in the range
of -175 C to > 600 °C, UHV to one atmosphere. |
| Transmission
Electron Microscopy |
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The JEOL 2010F
is a state-of-the-art 200kV microscope with a field-emission
gun. It is equipped with energy dispersive spectroscopy
(EDS) and an energy filter for electron energy-loss spectroscopy
(EELS) and energy filtering of images and diffraction patterns.
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selected sintering of a bimodal array of self-organized
gold nanoparticles observed in the JEOL 2010F
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| Lattice
Imaging of Nanoparticles |
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| A rhodium catalyst nanoparticle
supported on cerium oxide: |
Experimental HREM image |
Simulated HREM image
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Structural model |
Focused Ion Beam Thinning
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FEI Strata
DB 235; a dual-Beam FIB is a combination of a scanning electron
microscope (SEM) with a focused ion beam system (FIB). It
is used for preparing TEM samples from specific localized areas
and the nanopatterning of substrates. |
Stages of preparation of piezoelectric ceramic TEM-foil
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Optical Spectroscopy
and Luminescence Microscopy of Nanostructures
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Ferroelectric
domain engineering
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The
spatial resolution of a confocal microscope and near
field optical microscope with the high spectral resolution
and selectivity offered by combined excitation-emission
spectroscopy allows correlation of atomic scale
defects with optical properties observed on the nanoscale.
Domains in a confocal luminescence microscope (contrast
is obtrained through changes in the atomistic defect
structure that also determine mobility, shape of the
domains and the voltage required for domain switching).
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Laser
Raman Spectroscopy (Structure of Metal
Oxides, as small as 0.4 nm)
