Scroll To Top

Mechanical Testing

  • inston5567
  • inston5500r
  • instron8801
  • leco-micro
  • Instron ElectroMechanical Test Systems (5567 & 5500R) with environmental chamber
    • Instron 5567 electromechanical load frame
      • Load cells: ±500 N (100 lbf), ±30 kN (6800 lbf) tension/compression
      • Displacement: µm – m range
      • Strain gage channel (1)
      • 30 kN (6800 lbf) Wedge Tension Grips
      • compression platen
      • 3-point and 4-point bend fixtures
      • AVE2 video extensometer with 2D Digital Image Correlation (DIC)
      • Complete Bluehill 3 Software Suite
    • Instron 5500-R electromechanical load frame
      • Load cell: ±100 kN (22,500 lbsf, 22.5 kip) tension/compression
      • Displacement: µm – m range
      • 50 kN (11,250 lbf) Wedge Tension Grips
      • compression platen
      • 3-point and 4-point bend fixtures
      • Complete Bluehill 3 Software Suite
    Show features...
  • Instron Servohydraulic Mechanical Test Systems (8801) with environmental chamber
    • Standard height frame with maximum space between crosshead and base of 1260 mm and a minimum of 610 mm
    • Instron 8800 control electronics
    • ±50 kN (11,250 lbf) Dynacell load cell
    • ±5 kN (1125 lbf) Dynamic load cell
    • ±30 kN (6800 lbf, 6.8 kip) Fatigue Rated Hydraulic Wedge Tension Grips
    • ±5 kN 3-point and 4-point bend fixtures
    • Strain gage channel (1)
    • COD gauge
    • Complete Bluehill 3 Software Suite
    • WaveMatrix dynamic testing software
    • Instron Fracture Mechanics combination software package including da/dn (2490-906), KIC and CTOD (2490-907), JIC (2490-908)
    Show features...
  • Izod Impact Tester
  • Thin Film Mechanical Test System
    • Thin film stress tool, substrate curvature
      • N2, from 20 to 500 °C (293 to 773 K)
      • In Vacuum, from –243 to 27 °C (30 to 300 K)
      • In Vacuum, from –20 to 800 °C (253 to 1073 K)
      • Typical specimens: thin films on Si wafer substrates
    • Thin film stress measurement, in-situ wafer curvature during sputter deposition (k-Space MOS)
    • Thin Film Stress measurement by membrane resonance
      • Vacuum, from -190 to 500 °C (83 to 773 K)
      • Thermal-expansion stress, stress relaxation
      • Typical specimens: electrically conductive thin films on Si wafer substrates
      • Capable of stress measurement in films of 20-100 nm thickness
    • Thin Film Bulge test
      • Vacuum, from 10 – 80 °C
      • Typical specimens: electrically conductive thin films on Si wafer substrates
      • Same sample geometry as membrane resonance; complementary technique
      • Capable of stress measurement in films of nano-scale thickness
    Show features...
  • Hysitron nanoindenter
    • Nanoindentation (Hysitron Triboscope on DI/VEECO MM-AFM)
      • Surface imaging with indentation tool
      • Vertical loading: 1nN – 10 mN, Lateral loading: 3 µN – 10 mN
      • Scratch testing, micro/nano-wear testing
      • Heating to 150 °C
      • Typical specimens: thin films, coatings, treated surfaces, small structures
    • Nanomechanical testing in SEM (Hysitron PI-85 Picoindenter)
      • Simultaneous high resolution imaging and indentation, compression, bending, or tension
      • Typical specimens: thin films, coatings, treated surfaces, multi-phase materials, small structures, nanowires
      • Load resolution: ~1 µN, max load 10 mN
      • Displacement: 5 nm – 50 µm
    Show features...
  • Gleeble Thermo-Mechanical Simulator
  • Leco Microhardness testers
    • Micro-tensile load frame
      • Load resolution: <1 mN
      • Displacement: 5 nm – 50 µm
      • Ideal for tension and fatigue testing
      • Typical specimens: thin films, fine wires
    • Mini-tensile load frame
      • Load cells: 250 g-f, 100 lbs., 1000 lbs. tension/compression
      • Displacement: µm – mm range
      • Tension, compression, 3 or 4 point bending
      • Typical specimens: wires, foils, small structures (metal, ceramic, polymer)
    • Mini-penetration load frame
      • Load cells: 250 g-f, 100 lbs., 1000 lbs. tension/compression
      • Displacement: µm – mm range
      • Penetration and puncture
      • Typical specimens: soft polymers, natural tissue
    • Nano/Micro-contact apparatus
      • 10 g-f load cell, 0.1 mN load resolution
      • Simultaneous load and contact resistance measurements
    Show features...

[ Main facilities page ]