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Electron Microscopy Facility
Characterization
Facilities
The Nanocharacterization Laboratory at Lehigh contains
the largest electron
microscopy laboratory in the U.S., with a suite of 12 scanning,
transmission and scanning / transmission instruments. These are
well suited for characterizing nanoscale structures and chemistry
via an unparalleled range of imaging and analytical methods.
Infrastructure and Support. The Electron Microscopy
facility has excellent supporting services to keep the instruments
at peak performance and to optimize their use. There are complete
specimen preparation facilities including a Gatan PIP's, a plasma
cleaner, chemical jet polishers, dimplers, wire saws, diamond cutting
wheels and a comprehensive metallographic suite. In addition, there
are dark rooms, facilities for digital image acquisition and manipulation,
off-line computers for data analysis, and extensive microscopy-related
software. Modifications to the instruments can be developed with
the aid of a machine shop which is nearby.
The Nanocharacterization Laboratory houses the
world's highest resolution X-ray analytical microscope - a unique
instrument custom designed for nanoscale analysis and imaging. The
center also recently operates a versatile Focused Ion Beam (FIB)
instrument for nanomachining.
The annual
Lehigh Microscopy School utilizes many of these instruments
and is the largest and longest running course on electron microscopy
and analysis. The school now includes the only U.S. course on the
"Characterization of Nanostructures". This course is an
integrated overview of the different classes of nanostructured materials
(quantum structures and devices, nanotubes, nanowires, multilayer,
self-assembled materials). It also describes the electron optical
tools and techniques currently available to analyze nanomaterial
morphology, structure and chemistry.
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