Lehigh Microscopy School
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Textbooks / Course Materials
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"This course covered a great deal and a wide range of topics. I found the lectures to be very informative and useful. Lots of information provided with adequate explanation. Instructors took time to answer questions."  
- From a 2015 participant

Textbooks and Course Materials

As a participant you will receive your own copy of one of the textbooks authored by the course lecturers:

Scanning Electron Microscopy and X-ray Microanalysis, 3rd edition (2003), Kluwer/Springer Publishers, New York

Transmission Electron Microscopy: A Textbook for Materials Science, 2nd Edition (2009), Kluwer/Springer Publishers, New York

Introduction to Focused Ion Beam: Instrumentation, Theory, Techniques, and Practice (2005) (eds. L.A. Giannuzzi and F. A. Stevie) Springer, New York

A link to a website containing exclusive imaging and analysis software.

A notebook containing course notes of PowerPoint slides presented by the lecturers. A laboratory workbook authored by the course lecturers.

The Lehigh Microscopy School is supported by the suppliers of the following software that is used in the School:

Electron Flight Simulator (Monte Carlo calculations) Demo

MeX (3D image analysis) Demo

NIST DTSA II (Desktop Spectrum Analyzer)

NISTZAF and TRYZAF (Quantitative Electron Probe Microanalysis Data Correction Software) , John Armstrong (e-mail: AaesJTA@aol.com)

SRIM (Ion Penetration Simulation)

Win Xray (X-ray Analysis)

CASINO (Monte Carlo)

Image J (Image Processing)

CalcZAF (EPMA calculation and modeling utility)


Textbooks written by course lecturers

Lehigh University