Textbooks and Course Materials

As a participant you will receive your own copy of one of the textbooks authored by the course lecturers:

Scanning Electron Microscopy and X-ray Microanalysis, 3rd edition (2003), Kluwer/Springer Publishers, New York

Advanced Scanning Electron Microscopy and X-ray Microanalysis (1986), Kluwer/Plenum Publishers, New York

Transmission Electron Microscopy: A Textbook for Materials Science (1996), Kluwer/Springer Publishers, New York

Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Application, by Dawn Bonnell (2000), Wiley Publishers, New Jersey

Introduction to Focused Ion Beam: Instrumentation, Theory, Techniques, and Practice (2005) (eds. L.A. Giannuzzi and F. A. Stevie) Springer, New York

The Lehigh CD-ROM with exclusive imaging and analysis software

A notebook containing course notes of PowerPoint slides presented by the lecturers. A laboratory workbook authored by the course lecturers.

The Lehigh Microscopy School is supported by the suppliers of the following software that is used in the School:

Electron Flight Simulator (Monte Carlo calculations)

MeX (3D image analysis)

ACT (automatic diffraction in the TEM)

Nanotech WSxM (from Nanotech Electronica)

NIH Image (Image Processing)

SCION Image (Image Processing)

NISTZAF and TRYZAF (Quantitative Electron Probe Microanalysis Data Correction Software) , John Armstrong (e-mail: AaesJTA@aol.com)

SRIM (Ion Penetration Simulation)

Win Xray (X-ray Analysis)

CASINO (Monte Carlo)

Image J (Image Processing)