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As a participant you will receive your own copy of one of the
textbooks authored by the course lecturers:
Scanning
Electron Microscopy and X-ray Microanalysis, 3rd edition
(2003), Kluwer/Springer Publishers, New York
Advanced
Scanning Electron Microscopy and X-ray Microanalysis
(1986), Kluwer/Plenum Publishers, New York
Transmission
Electron Microscopy: A Textbook for Materials Science
(1996), Kluwer/Springer Publishers, New York
Scanning
Probe Microscopy and Spectroscopy: Theory, Techniques, and Application,
by Dawn Bonnell (2000), Wiley Publishers, New Jersey
Introduction to Focused Ion Beam: Instrumentation, Theory, Techniques, and Practice (2005) (eds. L.A. Giannuzzi and F. A. Stevie) Springer, New York
The Lehigh CD-ROM with exclusive imaging and analysis software
A notebook containing course notes of PowerPoint slides presented
by the lecturers. A
laboratory workbook authored by the course lecturers.
The Lehigh Microscopy School is supported by the suppliers of the following software that is used in the School:
Electron Flight Simulator (Monte Carlo calculations)
MeX (3D image analysis)
ACT (automatic diffraction in the TEM)
Nanotech WSxM (from Nanotech Electronica)
NIH Image (Image Processing)
SCION Image (Image Processing)
NISTZAF and TRYZAF (Quantitative Electron Probe Microanalysis Data Correction Software) , John Armstrong (e-mail: AaesJTA@aol.com)
SRIM (Ion Penetration Simulation)
Win Xray (X-ray Analysis)
CASINO (Monte Carlo)
Image J (Image Processing)
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