| |
SEM/X-ray Analysis |
 |
Dave Ackland, Lehigh University
dwa1@lehigh.edu |
 |
John Armstrong, American University
jarmstro@american.edu |
 |
Arlan Benscoter, Lehigh University
aob0@lehigh.edu |
 |
Paul Carpenter, Washington University
paulc@levee.wustl.edu
|
 |
Helen Chan, Lehigh University
hmc0@lehigh.edu
http://www.lehigh.edu/~inmatsci/faculty/chan/Chan.html |
 |
Patrick Echlin, University of Cambridge
p.echlin@ntlworld.com |
 |
John Friel, Temple University
jjfriel@temple.edu
http://www.jjfriel.net/publications.html |
 |
Joe Goldstein*, University of Massachusetts
jig0@ecs.umass.edu
http://www.ecs.umass.edu/mie/faculty/goldstein.html |
 |
Richard Hertzberg, Lehigh University
rwh1@lehigh.edu
http://www.lehigh.edu/~inmatsci/faculty/hertzberg/Hertzberg.htm |
 |
David Joy*, University of Tennessee
djoy@utk.edu
http://pciserver.bio.utk.edu/metrology |
 |
Dan Kremser, Battelle Memorial Institute
kremserd@battelle.org |
 |
Eric Lifshin, SUNY Albany
elifshin@uamail.albany.edu |
 |
Charles Lyman*, Lehigh University
cel1@lehigh.edu
http://www.lehigh.edu/~inmatsci/faculty/lyman/Lyman.html |
 |
John Mansfield, University of Michigan
jfmjfm@engin.umich.edu
http://emalwww.engin.umich.edu/people/jfmjfm/jfmjfm.html |
 |
Dale Newbury*, NIST
newbury@enh.nist.gov |
 |
Frank Platek , US FDA
fplatek@ora.fda.gov |
 |
John Henry Scott, NIST
johnhenry.scott@nist.gov
http://www.cstl.nist.gov/div837/Division/ |
 |
Bill Thompson, ALIS Corporation,
a Carl Zeiss SMT Company
b.thompson@smt.zeiss.com |
 |
Karen Winey, University of Pennsylvania
winey@lrsm.upenn.edu
http://www.seas.upenn.edu/mse/fac/winey.html |
| |
Scanning Probe Microscopy |
 |
Dawn Bonnell*, University of Pennsylvania
bonnell@lrsm.upenn.edu
http://www.seas.upenn.edu/mse/fac/bonnell.html |
 |
Joe Griffith, Agere Systems, retired
jegrif@aol.com |
 |
Brian Huey, University of Connecticut
bhuey@ims.uconn.edu |
 |
Sergei V. Kalinin, Oak Ridge National Laboratory
Sergei2@ornl.gov
www.sergei2.kalininweb.com |
 |
Bruce Koel, Lehigh University
brk205@lehigh.edu
www-rcf.usc.edu/~koel |
 |
Dmitri Vezenov, Lehigh University
dvv205@lehigh.edu |
 |
Rick Vinci, Lehigh University
rpv2@lehigh.edu
http://www.lehigh.edu/~inmatsci/faculty/vinci/vinci.html |
| |
Focused Ion Beam |
 |
Lucille A. Giannuzzi*, FEI Company
Lucille.Giannuzzi@fei.com
|
 |
Peter Gnauck, Carl Zeiss NTS GmbH
wgnauck@smt.zeiss.com
http://www.smt.zeiss.com |
 |
Joe Michael*, Sandia National Laboratories
jrmicha@sandia.gov |
| |
Analytical Electron Microscopy |
 |
Rocco Cerchiara, E. A. Fischione Instruments, Inc.
rr_cerchiara@fischione.com
www.fischione.com |
 |
Alwyn Eades, Lehigh University
jae5@lehigh.edu
http://www.lehigh.edu/~inmatsci/faculty/eades/Eades.html |
 |
John Hunt, Gatan, Inc.
jhunt@gatan.com |
 |
Tom Kelly, IMAGO
tkelly@imago.com
http://www.imago.com |
 |
Chris Kiely, Lehigh University
chk5@lehigh.edu
http://www.lehigh.edu/~inmatsci/faculty/kiely/Keily.html |
 |
David J. Larson, Imago Scientific Instruments
dlarson@imago.com |
 |
Masashi Watanabe, Lehigh Universitiy
maw3@lehigh.edu |
| |
* Course organizers |
