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"Very eye-opening and well worth the time - thank you! Instructors were great lecturers, friendly, and approachable."  
-From 2007 participant
 
   
   
       
  Instrumentation

In the past three years the following manufacturers have brought their top-of-the-line instruments…the largest array of new instruments at any course in the world:

Scanning Electron Microscopes
ASPEX 3025 with Perception

Carl Zeiss EVO SMT

Carl Zeiss SMT Ultra 55

FEI Company Quanta 3D ESEM

FEI Company XL 30 SEM

Hitachi 4300VP (FE-SEM )

Hitachi S3400N (VP SEM)

JEOL 6390LV (ESEM)

JEOL 733 Electron Microprobe

Focussed Ion Beam System
Carl Zeiss SMT Crossbeam FIB

FEI Dual Beam 235 FIB

Analytical Transmission Electron Microscopes
JEOL 2200FS-Omega Filter, CEOS aberration corrector

VG Microscopes HB-603, Nion aberration corrector

Gatan 666 PEELS & 766 DigiPEELS

JEOL 2000FX-Gatan PEELS

X-ray and Other Analyis Systems
Advanced MicroBeam Inc.

Bruker AXS Microanalysis

Bruker AXS QUANTAX 400

EDAX Genesis EDS

Evex Analytical EDS

Gatan Cathodoluminescence (CL) System

Gatan 688 Digiscan with Digital Micrograph

Gatan/XRT X-ray Ultramicroscope

HKL EBSD

Oxford Instruments Crystal EBSD

Oxford Instruments IncaEnergy EDS

Oxford Instruments Inca Wave WDS

Princeton Gamma Tech (Bruker AXS) Spirit

TSL/EDAX-OIM

Thermo NORAN System 6

Specimen Coating and Sample Preparation Equipment
Denton Vacuum

Fischione Instruments

Omniprobe

SPI Supplies

Scanned Probe Microscopes

Asylum Research

Hysitron

Molecular Imaging - Agilent

RHK Technology

Veeco

 

Dave Ackland
MSA Outstanding
Technologist Award 1996
       
 
Lehigh University