Scanning Transmission Electron Microscopy:
From Fundamentals to Advanced Applications
June 5-9, 2017
This course provides an understanding of the concepts, instrumentation, and applications of STEM. The course explores basic and advanced levels of the following topics: STEM imaging, aberration correction, EDS, EELS, CBED, tomography, data manipulation, sample preparation, and a review of complementary techniques.
Mark Aindow, John Hunt, Rob Keyse, Chris Kiely, Charles Lyman, and Masashi Watanabe
Course Outline (PDF)
Each registrant receives the textbook, Transmission Electron Microscopy: A Textbook for Materials Science, 2nd Edition by Williams and Carter (Kluwer Academic/Plenum Publishers, 2009), as well as detailed laboratory notes which provide experimental results and worked problems. The book and the notes are authored by the lecturers of the course. In addition, everyone receives additional notes for specific lecturers, a list of vendors and equipment suppliers, and a link to a website containing exclusive imaging and analysis software.