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Scanning Probe Microscopy: From Fundamentals to Advanced Applications

June 9-12, 2008
Cost: $2,450

This course provides an understanding of the concepts, instrumentation, and applications of the rapidly expanding field of scanning probe microscopy (SPM). AFM and STM will be covered extensively; the course will also feature advanced techniques for imaging and measuring electronic, magnetic and mechanical properties, including nanoindentation. The theory of operation for both imaging and spectroscopy will be addressed, with attention paid to instrumental artifacts and methods to avoid them. The lectures will cover a wide range of applications in the physical and biological sciences and in engineering. Hands-on laboratory exercises are used extensively throughout the course.

Course Lecturers
Dawn Bonnell, Joe Griffith, Bryan Huey, Sergei Kalinin, Bruce Koel, Dmitri Vezenov, and Rick Vinci

Course Outline MS Word Format | PDF Format

Course Literature/Textbooks
Each registrant receives the textbook, Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, 2nd edition, by Dawn Bonnell (Wiley 2000), as well as detailed laboratory notes which provide experimental results and worked problems. The book and the notes are authored by the lecturers of the course. In addition, everyone receives notes for specific lectures, a list of vendors and equipment suppliers, and the LehighCD-ROM.