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Lecturers
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Cost: $2,660
This course provides an understanding of the concepts, instrumentation, and applications of scanning probe microscopy (SPM). In particular, AFM will be covered extensively in lectures and nearly equal time in labs. Topics include imaging and measuring topography; electronic, magnetic, and mechanical properties of inorganic and organic materials; handling of biological specimens; STM; and tip and cantilever selection.
Course Lecturers
Phil Russell
Course Outline MS
Word Format | PDF Format
Course Literature/Textbooks
Each registrant receives the textbook, Scanning Probe Microscopy
and Spectroscopy: Theory, Techniques, and Applications, 2nd edition, by Dawn
Bonnell (Wiley 2000), as well as detailed laboratory notes which
provide experimental results and worked problems. The book and the
notes are authored by the lecturers of the course. In addition,
everyone receives notes for specific lectures, a list
of vendors and equipment suppliers, and the Lehigh DVD.
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