Scanning Electron Microscopy and X-ray Microanalysis

June 5-9, 2017

Cost: $3,450

Early Bird Discount! Register and pay in full by April 14. Registration deadline is May 5 for all Specialized Courses, and June 5 for the SEM course.

Course Description

This course is designed for individuals who use scanning electron microscopy and x-ray microanalysis in academic, governmental, or industrial laboratories: engineers, technicians, physical and biological scientists, clinicians, geologists, forensic scientists and technical managers. Through an integrated series of lectures and laboratory sessions, it will provide a working knowledge of the principles of these two related techniques as well as an introduction to variable-pressure (environmental) and low-voltage SEM. Special optional sessions will be conducted for students interested specifically in specialized imaging techniques, x-ray analysis of difficult specimens, organic materials, electronic materials, fracture/failure analysis, and forensic analysis. Students are encouraged to bring their own specimens to the course.

Course Lecturers

John Armstrong, Emma Bullock, Paul Carpenter, Helen Chan, Rob Keyse, Carol Kiely, Chris Kiely, Animesh Kundu, Charles Lyman, John Mansfield, Joe Michael, William Mushock, Dale Newbury, Philip Oshel, Frank Platek, Nicholas Ritchie, John Henry Scott, Keana Scott, Bradley Thiel, Richard Vinci, Masashi Watanabe

Course Outline (PDF)

Course Literature/Textbooks

Each registrant receives the textbook, Scanning Electron Microscopy and X-ray Microanalysis, 3rd edition, Kluwer/Springer Publishers (2003), as well as detailed laboratory notes which provide experimental results and worked problems. The book and the notes are authored by the lecturers of the course. In addition, everyone receives additional notes for specific lecturers, a list of vendors and equipment suppliers, and a link to a website containing exclusive imaging and analysis software.