Lehigh Microscopy School
Lehigh Microscopy SchoolCoursesRegistration
Scanning Electron Microscopy
and X-ray Microanalysis
Introduction to SEM and EDS
for the New SEM Operator
Focused Ion Beam (FIB):
Instrumentation and Applications
Problem Solving: Interpretation and Analysis
Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques
Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications

Lecturers | Literature | Register | Accommodation | Meals | Getting Here

Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques


June 6-10, 2016
Cost: $3,400

Discover how to get the highest quality results for a wide variety of materials doing analysis and x-ray mapping with silicon drift detectors, Si(Li) EDS, and WDS. Master problem solving and quantitative analysis using advanced software tools. Learn how to get the best analytical resolution by working at low voltages. Get new tips on how to deal with ‘pernicious’ samples like beam-sensitive materials, particles, surface layers, and rough surfaces. Learn the best ways to analyze light and trace elements, handling bad peak overlaps. Become a better analyst with increased skills and improve those job credentials.

Course Outline (PDF)

Course Lecturers
Julien Allaz, John Armstrong, Paul Carpenter, Eric Lifshin, Bill Mushock, Nicholas Ritchie

Course Literature/Textbooks
Each registrant receives the textbook, Electron Probe Quantitation, Kluwer/Springer Publishers (1991), as well as detailed laboratory notes which provide experimental results and worked problems. The book and the notes are authored by the lecturers of the course. In addition, everyone receives additional notes for specific lecturers, a list of vendors and equipment suppliers, and a link to a website containing exclusive imaging and analysis software.

Register and pay in full by April 15 to receive an early bird discount! See registration form for prices.

NOTE: Please email for availability after May 6 (Sharon.Coe@Lehigh.edu).

Lehigh University