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Problem Solving with SEM, X-Ray Microanalysis,
and Electron Backscatter Patterns

June 11-15, 2012
Cost: $2,990

Your laboratory has spent somewhere between $250,000 to $1M (or more!) to purchase a high performance scanning electron microscope (SEM) equipped with advanced characterization techniques such as x-ray microanalysis by energy dispersive spectrometry (EDS), electron backscatter diffraction (EBSD), and ion beam specimen preparation. Now it is up to you to apply this advanced instrumentation to actually solve problems that will justify this large investment.  Learn from the experts how to attack real problems with microscopy, compositional analysis, crystal structure determination, and ion beam specimen modification. 

Intended for scientists, engineers, technicians, and technical managers who seek an intermediate/advanced course, this Problem Solving course assumes you have SEM/x-ray microanalysis experience equivalent to one week of the Lehigh Microscopy School . However, we will not throw you in at the deep end.  Intensive review lectures will highlight the important fundamentals of SEM imaging and EDS x-ray microanalysis, as well as introduce electron backscatter diffraction and ion beam specimen preparation. Topics to be covered in lectures and laboratories include high-resolution SEM, low-voltage SEM, variable-pressure SEM (environmental), x-ray spectrometry by EDS including the new silicon drift detectors (SDD-EDS), wavelength dispersive spectrometry (WDS), crystallography by EBSD, ion beam specimen cutting in “dual-beam” instruments, digital image processing, and image/microanalysis modeling.

BRING A SPECIMEN-SOLVE A PROBLEM! Students are encouraged to bring their own specimens and/or data such as SEM images (e.g., JPEG, TIFF formats), EDS x-ray spectra (export as MSA/MAS format), EBSD patterns, etc. These will be examined in small group laboratory sessions with problem solving discussions led by lecturers and laboratory demonstrators from the participating vendors. Software will be provided (Monte Carlo simulation, image processing, electron/x-ray database).

Course Outline MS Word Format | PDF Format

Course Lecturers
Alwyn Eades, Joe Michael, John Henry Scott, Keana Scott and Bill Thompson

Course Literature/Textbooks
Each registrant receives the textbook, Scanning Electron Microscopy and X-ray Microanalysis, 3rd edition, Kluwer/Springer Publishers (2003), as well as detailed laboratory notes which provide experimental results and worked problems. The book and the notes are authored by the lecturers of the course. In addition, everyone receives additional notes for specific lecturers, a list of vendors and equipment suppliers, and the Lehigh DVD.