Lehigh Microscopy School
 
   
Lehigh Microscopy SchoolCoursesRegistration
MAIN COURSE:
Scanning Electron Microscopy
and X-ray Microanalysis
Introduction to SEM and EDS
for the New SEM Operator
ADVANCED COURSES:
Problem Solving with SEM
and X-ray Microanalysis
Quantitative X-ray Microanalysis:
Problem Solving Using EDS and WDS Techniques
Analytical Electron Microscopy
at the Nanometer-Scale
Focused Ion Beam (FIB)
Instrumentation and Applications
Scanning Probe Microscopy:
From Fundamentals to Advanced Applications
   
   
 

Lecturers | Literature | Register | Accommodation | Meals | Getting Here


Introduction to SEM and EDS for the New Operator

June 1, 2008
Cost: $750.00
(offered only to main course participants)

A one-day course with lectures and labs related to the basic operation of the SEM. Enrollment will be limited to 60 participants who are also attending the main SEM course beginning on Monday.

Course Outline MS Word Format | PDF Format

Course Lecturers
Helen Chan, Alwyn Eades, Patrick Echlin, and Charles Lyman

Course Literature/Textbooks
Course participants will receive course notes authored by the course lecturers.

   
 
Lehigh University