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Lecturers
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Cost: $2,450
This course is designed for those using or are interested in using the FIB or FIB/SEM platforms in academic, governmental, or industrial laboratories in either the physical or biological sciences. Basic ion-solid interaction theory will be introduced and used in describing methods of specimen preparation for SEM, TEM, AFM, Auger, SIMS, and atom probe. FIB/SEM analytical characterization, and milling/deposition techniques for nanotechnology will also be discussed.
Course Lecturers
Rocco Cerchiara, Lucille Giannuzzi, Peter Gnauck, and Joe Michael
Course Outline MS Word Format | PDF Format
Course Literature/Textbooks
Each registrant teceives the textbook, Introduction to Focused Ion Beam: Instrumentation, Theory, Techniques and Practice (2005) (eds. L. A. Giannuzzi and F. A. Stevie) Springer Publishers, as well as detailed laboratory notes which provide experimental results and worked problems. The book and the notes are authored by the lecturers of the course. In addition, everyone receives additional notes for specific lectures, a list of vendors and equipment suppliers, and the Lehigh CD-ROM with exclusive imaging and analysis software.
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