Lehigh Microscopy School
Lehigh Microscopy SchoolCoursesRegistration
Scanning Electron Microscopy
and X-ray Microanalysis
Introduction to SEM and EDS
for the New SEM Operator
Focused Ion Beam (FIB):
Instrumentation and Applications
Problem Solving: Interpretation and Analysis
Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques
Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications

Lecturers | Literature | Register | Accommodation | Meals | Getting Here

There is still time to register for all courses (including the advanced courses).

Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications

June 6-10, 2016
Cost: $3,400

This course provides an understanding of the concepts, instrumentation, and applications of STEM. The course explores basic and advanced levels of the following topics: STEM imaging, aberration correction, EDS, EELS, CBED, tomography, data manipulation, sample preparation, and a review of complementary techniques.

Course Outline (PDF)

Course Lecturers
Alwyn Eades, John Hunt, Rob Keyse, Chris Kiely, Charles Lyman, and Masashi Watanabe

Course Literature/Textbooks
Each registrant receives the textbook, Transmission Electron Microscopy: A Textbook for Materials Science, 2nd Edition by Williams and Carter (Kluwer Academic/Plenum Publishers, 2009), as well as detailed laboratory notes which provide experimental results and worked problems. The book and the notes are authored by the lecturers of the course. In addition, everyone receives additional notes for specific lecturers, a list of vendors and equipment suppliers, and a link to a website containing exclusive imaging and analysis software.

Lehigh University