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Cost: $2,450
This course gives an integrated in-depth description of the capabilities of the latest analytical transmission electron microscopes, which can characterize the atomic-level structure, the nanometer-scale chemistry, and many other facets of industrially important thin films and particles. Topics include: atomic-resolution imaging of atomic structure and crystal defects; nanometer-scale elemental analysis and mapping via quantitative x-ray and electron energy-loss spectrometry; convergent beam electron diffraction; and specimen preparation. Lehigh's two aberration-corrected instruments (TEM and STEM) will be available for laboratory demonstrations.
Course Outline MS
Word Format | PDF Format
Course Lecturers
Rocco Cerchiara, Alwyn Eades, Chris Kiely, David Larson, Charles Lyman, and Masashi Watanabe
Course Literature/Textbooks
Each registrant receives the textbook, Transmission
Electron Microscopy: A Textbook for Materials Science by Williams
and Carter (Kluwer Academic/Plenum Publishers, 1996), as well as
detailed laboratory notes which provide experimental results and
worked problems. The book and the notes are authored by the lecturers
of the course. In addition, everyone receives additional notes for
specific lecturers, a list of vendors and equipment suppliers, and
the Lehigh CD-ROM. |
