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LU Microscopes in the News
FBI's Anthrax Analysis
Abberation-corrected Microscopes at Lehigh
Bringing 2020 Vision to the Nano-world
The Atomic Hammer and Chisel
Remote Microscopy and Distance Learning
 

May 31 - June 12, 2009
Lehigh University
Bethlehem, PA USA

39 Years of Excellence

"Very eye-opening and well worth the time — thank you! Instructors were great lecturers, friendly, and approachable. "

-From 2007 participant

  
2009 Courses
MAIN COURSE:
Scanning Electron Microscopy
and X-ray Microanalysis
Introduction to SEM and EDS
for the New SEM Operator
ADVANCED COURSES:
Problem Solving with SEM
and X-ray Microanalysis
Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques
Scanning Transmission Electron Microscopy: From Fundamentals to Advanced Applications
Focused Ion Beam (FIB)
Instrumentation and Applications
Scanning Probe Microscopy:
From Fundamentals to Advanced Applications
   
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