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Lecturers
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Cost: $2,850
This course is designed for individuals who use scanning electron microscopy and x-ray microanalysis in academic, governmental, or industrial laboratories: engineers, technicians, physical and biological scientists, clinicians, geologists, forensic scientists and technical managers. Through an integrated series of lectures and laboratory sessions, it will provide a working knowledge of the principles of these two related techniques as well as an introduction to variable-pressure (environmental) and low-voltage SEM. Special optional sessions will be conducted for students interested specifically in specialized imaging techniques, x-ray analysis of difficult specimens, organic materials, electronic materials, fracture/failure analysis, and forensic analysis. Students are encouraged to bring their own specimens to the course.
Course Lecturers
Dave Ackland, Helen Chan, Alwyn Eades, Patrick Echlin,
John Friel, Joe Goldstein, Richard Hertzberg, David Joy, Carol Kiely,
Chris Kiely,
Dan Kremser, Charles Lyman, John Mansfield,
Dale Newbury,
Frank Platek,
Nicholas Ritchie, Bradley Thiel, and Karen Winey
Course Outline MS
Word Format | PDF Format
Course Literature/Textbooks
Each registrant receives the textbook, Scanning Electron
Microscopy and X-ray Microanalysis, 3rd edition, Kluwer/Springer Publishers (2003), as well as detailed laboratory notes which provide
experimental results and worked problems. The book and the notes
are authored by the lecturers of the course. In addition, everyone
receives additional notes for specific lecturers, a list of vendors
and equipment suppliers, and the Lehigh DVD. |
