FEI Strata DB 235

This instrument combines a scanning electron microscope (SEM) with an ion beam system for nanoscale erosion of the sample. The SEM is a high-performance field-emission microscope. The ion-beam system has a gallium metal ion source giving a high-brightness ion beam. This beam can cut structures on the scale of nanometers. The instrument can be used for preparing transmission electron microscope (TEM) samples from specific areas of the specimen, as well as for undertaking a wide range of experiments in this nanofabrication facility.